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  • 1990-1994  (3)
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  • 1
    Electronic Resource
    Electronic Resource
    Z-scan measurement of χ(3) using top-hat beams (1994)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 65 (1994), S. 673-675 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Z-scan measurements of third-order optical nonlinearities are usually carried out with Gaussian beams. Good quality Gaussian beams are not readily available, however, and to overcome this limitation, we analyze the Z-scan experiment using top-hat beams. A graphical method is developed which allows straightforward determination of the nonlinear refraction and absorption coefficients from experimental data. The advantage of using top-hat beams is that it allows Z-scan measurements using a wide variety of laser sources, including dye lasers. χ(3) values obtained using Z-scan measurements with top-hat and Gaussian beams are compared for the liquid crystal 5CB (4-cyano-4'-n-pentybiphenyl).
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.112264
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    Paper (German National Licenses)
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  • 2
    Electronic Resource
    Electronic Resource
    Comparison of magnetic and electric field induced switching in polymer dispersed liquid crystal films (1992)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 60 (1992), S. 3132-3134 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We report, for the first time, the switching of a polymer dispersed liquid crystal film by a magnetic field. We have measured the optical transmittance of such samples as a function of magnetic and electric field strength. The response to these fields is similar. The observed behavior is in good agreement with theoretical predictions. The magnetic field results give information about the origin of the observed hysteresis.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.106746
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    Paper (German National Licenses)
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  • 3
    Electronic Resource
    Electronic Resource
    Z-scan technique using top-hat beams (1993)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 63 (1993), S. 1613-1615 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Top-hat instead of Gaussian beams are used in Z-scan experiments to measure nonlinear optical Kerr coefficients of materials. An empirical expression is obtained which allows direct calculation of the Kerr coefficient from measured peak–valley transmittance differences. Predictions of the model are compared with Z-scan measurement on CS2. Using top-hat beams, the sensitivity of Z-scan measurements is a factor of 2.5 greater than for Gaussian beams.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.110712
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    Paper (German National Licenses)
    Fulltext
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