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  • 1990-1994  (2)
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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 46 (1990), S. 83-86 
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: To solve the problems related to the phases of the structure factors in surface structure analysis by transmission electron diffraction, the dynamical diffraction in the bulk crystal underneath the surface layer is considered by the many-beam theory. In the case of normal beam incidence, the intensities of superlattice reflections from surfaces and/or adsorbed layers are used to discriminate whether the surface structure is substitutional or displacive in type. In the case where only two beams are strongly excited in the bulk crystal, the phases of the structure factors of the surface layer are determined by the rocking curve of the superlattice reflections.
    Type of Medium: Electronic Resource
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  • 2
    ISSN: 1434-6079
    Keywords: 81.30.-t ; 61.14.-x ; 36.40.+d
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract Solid-liquid transition of fine tin particles having diameter of 2–10 nm is studied in-situ by high-resolution transmission electron microscopy under a ultra-high vacuum condition. Melting temperature is confirmed to decrease with the decrease of particle diameter. The particles less than the critical size, 2r c⋍5 nm, are found to have a specific phase between the solid and the liquid phase. The particle in this “pseudo-crystalline” phase contains crystalline embryos in it. Particles larger than the critical size have sharp liquid-solid transition, which completed within the time resolution of our microscope observation, 33 ms upon heating or cooling process. Large solid particles have Wulff's polyhedron, while particles around the critical diameter have rather spherical shape. Structural anomaly at the critical size occurs all over the outer most surface layer slightly below the melting temperature. Origin of the “pseudo-crystalline” phase and surface pre-melting phenomena are discussed.
    Type of Medium: Electronic Resource
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