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  • 1990-1994  (5)
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Year
  • 1
    Electronic Resource
    Electronic Resource
    Magnetic and conversion electron Mössbauer spectroscopy studies in Fe/Ta multilayers : 37th Annual conference on magnetism and magnetic materials (1993)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 73 (1993), S. 6438-6440 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have prepared Fe/Ta multilayers by rf sputtering. A small 1-cm2 chip of 57Fe was placed on the Fe target. We studied the magnetization (M) and M-H loops and also carried out conversion electron Mössbauer spectroscopy (CEMS). The in-plane loops are rectangular with a lowest coercivity of 2.6 Oe. Magnetization studies indicate a dead Fe layer about 5 A(ring) thick at each interface. CEMS spectra for samples with t(Fe)≥54 A(ring) showed a typical six-line pattern, indicating the presence of bulk Fe. No other Fe sites could be detected. However, for t(Fe)=24 A(ring), where almost 50% of Fe is nonmagnetic, CEMS spectra showed the presence of a strong paramagnetic doublet.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.352625
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    Paper (German National Licenses)
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  • 2
    Electronic Resource
    Electronic Resource
    Beam divergence and ion density measurements for an induction coupled ion beam source (1992)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 63 (1992), S. 5234-5236 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: In this article the ion beam of H+ and Ar+ produced from the low-pressure radio frequency ionized plasma is analyzed for beam divergence. The divergence measurement method adopted for a low-energy beam is described. The divergence values for H+ and Ar+, respectively, are 0.4° and 1.1° for a beam energy of 2.5 kV. It is found that the beam divergence varies with the extraction voltage. In case of H+ beam, the divergence value varies from 2.8° to 0.4° for the extraction voltage of 500 V to 2.5 kV, and in the case of Ar+ beam this value is from 1.3° to 1.1° for the extraction voltage of 1000 V to 2.5 kV. The extraction electrode is concave outward as shown in the figure of the extraction system. The rf plasma is diagnosed using the double-probe technique for ion density estimation. The axial variation of the electron density and the electron temperature are obtained for both hydrogen as well as argon plasmas. The electron density is maximum, near the end of the coil.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1143433
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    Paper (German National Licenses)
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  • 3
    Electronic Resource
    Electronic Resource
    Induction-coupled ion-beam source : International conference on ion sources (1990)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 61 (1990), S. 490-492 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A prototype rf ion source for extracting a hydrogen-ion beam has been developed. The system consists of a rf source and a water-cooled quartz tube, which contains the plasma. The rf power is coupled through a four-turn coil located outside the tube. A perforated metal grid and an aperture located about 8 mm from the grid has an opening of 5 mm in diameter. The axially extracted beam is transported through a column of about 1 m maintained at a pressure of 10−4 Torr, while the pressure in the plasma region is about 10−2 Torr. The rf source is a class-C, variable-power oscillator of fixed frequency 7 MHz. Operating the system with about 300 W in the discharged plasma, a continuous proton beam of 55 μA has been observed at a distance of 10 cm from the extracter at a voltage of 2.5 kV. Under similar operating conditions an argon-ion beam of 14 μA has been extracted. Experiments are in progress to optimize the extraction of ions at 10 kV, increase the rf power, and provide a suitable focusing system to transport the beam at a distance of 1 m with maximum efficiency.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1141953
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    Paper (German National Licenses)
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  • 4
    Electronic Resource
    Electronic Resource
    Electrical conductivity of cerium dioxide doped with tantalum pentoxide (1992)
    Springer
    Journal of materials science 11 (1992), S. 501-503 
    Details
    ISSN: 1573-4811
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF00731118
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    Paper (German National Licenses)
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  • 5
    Electronic Resource
    Electronic Resource
    Electrical resistivity of plasma-sprayed titanium diboride coatings (1993)
    Springer
    Journal of materials science 28 (1993), S. 1655-1658 
    Details
    ISSN: 1573-4803
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Abstract Plasma-sprayed TiB2 coatings (50–600 μm thick) on alumina substrates have been developed and characterized. X-ray diffraction studies, thermal analysis and oxygen analysis of the coatings show that there is appreciable oxidation of TiB2 during the spray process. Partial oxidation of the boride during spraying strongly influences the electrical conductivity of the coatings, which is found to be 100–1000 times less than that of pure TiB2. Although use of argon as shield gas during the spray process brings down the resisitivity substantially, partial oxidation of TiB2 could not be totally avoided.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF00363363
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    Paper (German National Licenses)
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