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  • 1
    Electronic Resource
    Electronic Resource
    s.l. : American Chemical Society
    The @journal of physical chemistry 〈Washington, DC〉 78 (1974), S. 2166-2179 
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology , Physics
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    s.l. : American Chemical Society
    Biochemistry 28 (1989), S. 8039-8047 
    ISSN: 1520-4995
    Source: ACS Legacy Archives
    Topics: Biology , Chemistry and Pharmacology
    Type of Medium: Electronic Resource
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  • 3
    ISSN: 1520-4995
    Source: ACS Legacy Archives
    Topics: Biology , Chemistry and Pharmacology
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 65 (1989), S. 1384-1386 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Results of Monte Carlo simulations of Si and GaAs p-n electron emitters are presented. A single-electron Monte Carlo transport simulation is used to obtain the total number, including avalanche multiplication, of electrons which reach the surface of the semiconductor, as well as the fraction of these which overcome the work function and are emitted into the vacuum. The distribution function is obtained, as well as ensemble average of quantities such as the ionization coefficient. The efficiency of the device is calculated as a function of both the work function and the top conducting channel thickness. The potential performance of GaAs devices is explored via the Monte Carlo simulation, and calculated results for the Si device are compared to published experimental data.
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 64 (1988), S. 4278-4284 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Uniform charged liquid-hydrogen drops are produced using the method of field injection electrostatic spraying. This method consists of forming a meniscus of liquid hydrogen at the end of a glass nozzle and injecting charge into the liquid using a sharp electrode raised to a high voltage. A small pressure drop across the nozzle results in a constant volume flow rate of liquid through the nozzle allowing a drop to form and drip off. As the amount of charge injection increases with the raised needle electrode voltage, the drop size decreases due to the increased electrostatic forces compensating for the surface tension forces. As a result, the drops drip off at an increased frequency. Eventually a charged jet forms which in turn breaks up into small uniform charged drops. A detailed description of the experimental apparatus is presented. Experimental results are presented and discussed.
    Type of Medium: Electronic Resource
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  • 6
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 58 (1985), S. 2731-2735 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Inhibition of fluid flow instabilities in the melt by the axial magnetic field in Czochralski silicon crystal growth (AMCZ) is investigated precisely by a high-sensitivity striation etch in conjunction with temperature measurements. The magnetic field strength (B) was varied up to 4.0 kG, incremented mostly in 0.5-kG/2.5-cm crystal length. The convection flow was substantially suppressed at B≥1.0 kG. A low oxygen level of 2–3 ppm and a high resistivity of 400 Ω cm is achieved in the AMCZ silicon crystals at B≥1.0 kG. Random striations at B=0, characteristic of turbulent convection, assumed progressively a periodicity, indicative of oscillatory convection at 0.35〈B≤4.0 kG. The striation contrast or "intensity'' decreased steadily with the increase in B. At B=4 kG, most of the crystal was free of striations, although some weak, localized periodic striations persisted near the crystal periphery. Spreading-resistance measurement shows, however, a uniform dopant distribution in all crystal sections grown at 0.35〈B≤4.0 kG within a few percent.
    Type of Medium: Electronic Resource
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  • 7
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 58 (1985), S. 1255-1258 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: High-power beams (4–10 W/cm2) of Ti ions have been used to heat Fe and steel substrates to 600–800 °C during high fluence (5×1017/cm2) implantation. Auger sputter depth profiles find a stoichiometric TiC surface layer, about 100 nm deep, graded continuously into both Fe and steel substrates. Secondary ion mass spectrometry of Fe and steels implanted in 13CO atmospheres indicate that the carbon originates from the bulk in carbon steels but from the atmosphere in Fe foils. Transmission electron microscopy reveals a continuous layer of fine-grained (50–100 nm) TiC crystallites in a preferred Baker–Nutting orientation relationship with respect to underlying Fe grains. Abrasive-wear measurements performed with diamond paste (1–5 μm) show the TiC layer on hardened M2 steel is 3–10 times more wear resistant than the substrate. Sliding-wear studies find an extremely durable layer that reduces friction by up to 60%, and increases by 50% the contact-stress threshold of M2 tool steel to boundary lubrication. The metallurgical processes responsible for the TiC layer will be discussed, and the advantages of this high-temperature treatment will be presented.
    Type of Medium: Electronic Resource
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  • 8
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 61 (1987), S. 1456-1459 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Field fluctuations due to dopants in a p+−n junction have been calculated and used to study the effects on the impact ionization rate with a Monte Carlo simulation. Results are plotted along the direction normal to the interface. We report that the field fluctuations have no effect on the ionization rate in the dead space and a small and spatially delayed effect in the region after the dead space even though the field shows large and rapid fluctuations. A similar "averaged-out'' effect is also shown for the average electron energy. The enhancement in the ionization rate due to the field fluctuations which Shockley expected in his pioneering research is shown to be negligibly small.
    Type of Medium: Electronic Resource
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  • 9
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 60 (1986), S. 2626-2629 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A Monte Carlo simulation code has been developed to study the electron impact ionization in GaAs subject to nonuniform electric fields. Results are presented for the spatial evolution of the ionization rate and the average electron energy through a p+-n junction or Schottky barrier. We show that the dead space is significantly longer than estimated by simple ballistic models. For field variations typical for p+-n junctions or Schottky barriers, the results for the region after the dead space agree closely with steady-state calculations. Appropriate definition of the impact ionization rate in transient problems is discussed along with the Keldysh model.
    Type of Medium: Electronic Resource
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  • 10
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 64 (1988), S. 3057-3062 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A Monte Carlo code has been developed to study electron transport at 4.2 K in AlGaAs/GaAs tunneling hot electron transfer amplifier devices. Our model includes the effects of coupled plasmon-phonon interaction and the Pauli exclusion principle along with more conventional features. The numerical results demonstrate the existence of nearly ballistic transport in the base and the collector barrier, and confirm that the experiments by Heiblum et al. [Phys. Rev. Lett. 55, 2200 (1985)] indeed measure the exact energy distribution of injected ballistic electrons. The device characteristics such as transfer ratio and transit time have also been investigated in detail and are discussed along with the optimum operating conditions.
    Type of Medium: Electronic Resource
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