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  • 1985-1989  (2)
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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 57 (1985), S. 5386-5395 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The hole-electron pair generation region in a semiconductor bombarded by a scanning electron beam can be modeled as a circular cylinder tangent to the semiconductor surface. A cross-sectional plane normal to the cylinder is then examined. Under conditions of high semiconductor surface recombination velocity, a conformal transformation of this plane can be made to yield a geometry in which the method of images can be used to match boundary conditions at the junction and at the semiconductor surface. Thus, a solution for the electron-beam-induced current (EBIC) problem can be found in this manner when the generation region is external to the diffused or implanted region of a finite junction depth. An infinite series of images can be used to solve the problem when the generation region is within the diffused or implanted region under conditions of low, as well as high, surface recombination velocity. Thus, expected EBIC results are presented as a function of junction depth.
    Type of Medium: Electronic Resource
    Library Location Call Number Volume/Issue/Year Availability
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  • 2
    Electronic Resource
    Electronic Resource
    Oxford, UK : Blackwell Publishing Ltd
    Journal of oral pathology & medicine 15 (1986), S. 0 
    ISSN: 1600-0714
    Source: Blackwell Publishing Journal Backfiles 1879-2005
    Topics: Medicine
    Notes: Many substances have been found to cause enamel disturbances in toxic doses, and it has been postulated that these disturbances are linked to the formation of sub-ameloblastic cysts. In the present investigation, fluoride-induced sub-ameloblastic cysts in developing rat molars were related to fluoride dose, age of the animals, and the plasma fluoride level. The sub-ameloblastic cysts, which developed predominantly towards the end of the secretory stage of amelogenesis, appeared shortly after fluoride administration and regressed within 3 days. Hypoplasias and internal defects were found in the enamel under the disturbed ameloblast layer. The highest plasma fluoride levels were found in the youngest animals 24 h after injection. The frequency and size of the sub-ameloblastic cysts were clearly related to the fluoride-dose and age of the animal and, subsequently, to the plasma fluoride level.
    Type of Medium: Electronic Resource
    Library Location Call Number Volume/Issue/Year Availability
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