ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
A combined apparatus for Synchrotron Radiation (SR) was designed and developed in order to analyze the structure and properties of the solid surface. Two kinds of analyses; x-ray photoelectron spectroscopy (XPS) and x-ray absorption spectroscopy (XAS), are available using a 180° hemispherical electrostatic analyzer and/or other detection systems. High resolution XPS spectra were achieved with high signal-to-background ratio over a wide electron energy range up to 2600 eV using a monochromatized x ray (2600 eV) from SR. XAS spectra were obtained in two modes of total electron yield and Auger electron yield. The two modes described are complementary.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1140669
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