Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Journal of Applied Physics
59 (1986), S. 3537-3539
ISSN:
1089-7550
Source:
AIP Digital Archive
Topics:
Physics
Notes:
To overcome difficulties which arise when either the series resistance is too high or the Schottky barrier height is too low, a new and simple method was developed to measure barrier height. Crucial point is the application of a "one-sided'' configuration. This method was successfully applied to the GdSi2 system, where φB =0.38±0.005 eV was measured.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.336773
Permalink
Library |
Location |
Call Number |
Volume/Issue/Year |
Availability |