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  • 1985-1989  (1)
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    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 56 (1985), S. 1553-1556 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A Bragg crystal spectrometer, utilizing a microchannel plate coupled to optical film as the detection medium, has been constructed for use in soft x-ray spectroscopy. The sensitivity of this intensified gated camera to x-rays has been compared directly with standard x-ray film using a calibrated x-ray source. In addition, this high gain, intensified crystal spectrograph (ICS) has been used in an experiment to precisely measure spectral coincidences between x-ray lines in laser-generated plasmas, thus identifying candidates for photoresonant x-ray lasing schemes in the 10–21-A(ring) region. At long wavelengths the ICS was able to obtain useful data on faint lines in a single laser shot, rather than the multiple shots required by an adjacent spectrograph using x-ray film. It also allowed line coincidences to be verified by a new technique utilizing split disk targets. The design and construction of the ICS and results obtained with it are compared with those obtained with standard x-ray film.
    Type of Medium: Electronic Resource
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