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  • 1990-1994  (2)
  • 1980-1984  (3)
  • 1965-1969  (1)
  • 1
    Electronic Resource
    Electronic Resource
    Springer
    Computing 44 (1990), S. 159-168 
    ISSN: 1436-5057
    Keywords: reliability control ; computer simulation ; stochastic approximation ; stochastic processes with complete connections
    Source: Springer Online Journal Archives 1860-2000
    Topics: Computer Science
    Description / Table of Contents: Zusammenfassung Diese Arbeit hat das Ziel, Simulation einiger stochastischer Prozesse zusammen mit stochastischer Approximation zu benützen, um eine optimale Zeitfolge für die Zuverlässigkeitskontrolle zu bestimmen. Wir zeigen überdies, daß der resultierende stochastische Kontrollplan adaptiv ist.
    Notes: Abstract The aim of this paper is to use the simulation of some stochastic processes combined with the stochastic approximation technique, to determine the optimum sequence of moments of time for the reliability control. It is shown that the obtained stochastic approximation control plan is adaptive.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Springer
    The European physical journal 226 (1969), S. 160-174 
    ISSN: 1434-601X
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract Cesium atoms, enclosed in a glass vessel, are excited by a weak electrical discharge and irradiated by monochromatic light with wavelengths corresponding to the sharp, diffuse, and fundamental series. By light absorption, highly excited atoms are produced, which are ionized by electron collisions. These ions diffuse into the space charge region of a diode path, compensate partially the space charge, and increase the thermionic diode current. By this method, ionic currents of about 10 ions per sec can be detected. If the wavelength of the incident light is varied continuously, the complete absorption spectrum of excited cesium atoms can be found in the recorded diode current.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    Springer
    The European physical journal 347 (1993), S. 63-66 
    ISSN: 1434-601X
    Keywords: 27.50.+e
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract The low excited states of the69As nucleus have been described in the framework of theSU(6) particle-quadrupole-phonon coupling model (PTQM).
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    Springer
    The European physical journal 314 (1983), S. 55-58 
    ISSN: 1434-601X
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract The ratios of the ∥g∥-factors of the 7−, 4.635 MeV level in64Zn and 6−, 4.074 MeV and 7−, 4.250 MeV levels in66Zn has been found to be (1±0.18)∶(0.64±0.14)∶(0.60±0.12) by means of the recoil-into-gas (helium) integral perturbed angular correlation technique. The studied states were populated by the reactions51V(16O,p2n)64Zn atE 0=51 MeV and55Mn(14 N,2pn)66Zn atE N =54 MeV.
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    Springer
    Hyperfine interactions 15 (1983), S. 63-64 
    ISSN: 1572-9540
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract The ratio of the g-factors of the 5/2−, 0.359 MeV and 15/2+, 3.578 MeV levels in67Ga has been found to be (1±0.32)∶(0.40±0.09) by means of the recoil-into-gas (helium) integral perturbed angular correlation technique. The studied states were populated by the reaction57Fe(12C,pn)67Ga at EC=40 MeV.
    Type of Medium: Electronic Resource
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  • 6
    Electronic Resource
    Electronic Resource
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 12 (1983), S. 173-174 
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: K x-ray production cross-sections of Ag, Sn and Te by 32-80 MeV 32S ions have been measured. The dependence of target K x-ray yields on the target thickness was found to be negligible in the S (64 MeV) + Ag collision system. The experimental data are compared with some theoretical predictions.
    Additional Material: 1 Ill.
    Type of Medium: Electronic Resource
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