ISSN:
0142-2421
Schlagwort(e):
Chemistry
;
Polymer and Materials Science
Quelle:
Wiley InterScience Backfile Collection 1832-2000
Thema:
Physik
Notizen:
The American Society for Testing and Materials (ASTM) formed Committee E-42 on Surface Analysis in 1976. Subcommittees have been established for the four surface-analysis techniques in common use (AES, XPS, ISS, and SIMS) and for terminology, ion-beam sputtering, standard reference materials, and editorial processing. The principal objective of the committee and its component groups is to advance the field of surface analysis and the quality of surface analyses through the development of appropriate standards, standard procedures, standard materials, roundrobins, symposia, workshops, and publications. A review is given of recent activities of the committee and of work in progress. The success of the committee will depend a great deal on adequate communication and coordination with other interested individuals and groups to ensure the adequacy and quality of proposed standards and to prevent unnecessary confusion or duplication of effort. Suggestions are made for this purpose.
Zusätzliches Material:
2 Tab.
Materialart:
Digitale Medien
URL:
http://dx.doi.org/10.1002/sia.740030208
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