Library

X
feed icon rss

Your email was sent successfully. Check your inbox.

An error occurred while sending the email. Please try again.

Proceed reservation?

Export
  • 1
    Electronic Resource
    Electronic Resource
    Effects of gamma radiation on two aromatic polysulfones (1975)
    New York, NY [u.a.] : Wiley-Blackwell
    Journal of Applied Polymer Science 19 (1975), S. 405-417 
    Details
    ISSN: 0021-8995
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology , Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Two aromatic polysulfones, poly(oxy-1,4-phenylenesulfonyl-1,4-phenyleneoxy-1,4-phenyleneisopropylidene-1,4-phenylene) (I) and poly (oxy-1,4-phenylenesulfonyl-1,4-phenylene) (II), undergo crosslinking and chain scission at 30°C during γ-irradiation, the former being predominant in vacuum and the latter in air. Both processes occurred more readily in I, which contains isopropylidene linkages. Gel measurements gave G(crosslink) = 0.051, G(scission) = 0.012 for this polymer at 30°C in vacuum. Increased irradiation temperatures resulted in higher crosslinking and gas yields, especially above the glass transition temperature. The tensile strength, flexural strength, and modulus of I were unaffected by γ-irradiation up to about 50 Mrad in air, but the strength decreased markedly at higher doses. The elongation at break decreased progressively with dose. For both polymers, G(gas) = 0.04 at 30°C with the main products being SO2, H2, CO2, CH4, and H2O.
    Additional Material: 5 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/app.1975.070190208
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 2
    Electronic Resource
    Electronic Resource
    Effects of gamma radiation on two aromatic polysulfones. II. A comparison of irradiation at various temperatures in air-vacuum environmentsPresented in part at the First Chemical Congress of the North American Continent, Mexico City, December 1975. (1979)
    New York, NY [u.a.] : Wiley-Blackwell
    Journal of Applied Polymer Science 23 (1979), S. 2763-2775 
    Details
    ISSN: 0021-8995
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology , Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: The aromatic polysulfone poly(oxy-1,4-phenylenesulfonyl-1,4-phenyleneoxy-1,4-phenyleneiso-propylidene-1,4-phenylene) (I) showed no change in flexural yield strength after doses of γ-radiation up to 600 Mrad in vacuum at 35,80, and 125°C (Tg = 190°C)). However, the flexural strength decreased markedly with doses above 100 Mrad on irradiation in air, to 40-60% of the initial value after 200-400 Mrad, depending on the sample and the irradiation conditions. Chain crosslinking was predominant over scission for irradiation in vacuum at all temperatures; (G(X), G(S), and G(S)/G(X) increased with the irradiation temperature, but G(S)/G(X) decreased to zero above Tg. Poly(oxy-1,4-phenylenesulfonyl-1,4-phenylene) (II) behaved similarly, except that the flexural strength was found to be very dependent on the thermal treatment of the sample. This polymer showed a remarkable retention of its mechanical properties on irradiation up to 200°C (Tg = 230°C) in the absence of air, the flexural strength being retained up to 500 Mrad. Radiation annealing occurred at 35°C in vacuum and air and combined radiation and thermal annealing at 125 and 220°C. Progressive removal of surface layers from flexural test bars of I irradiated in air showed that the decrease in flexural strength with dose could be explained by a decrease in the molecular weight towards the surface resulting from radiation-oxidation reactions.
    Additional Material: 9 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/app.1979.070230921
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 3
    Electronic Resource
    Electronic Resource
    F. Maurice, L. Meny and R. Fixier (Editors), Microanalyse et Microscopie Electronique à Bayalage and its English translation Microanalysis and Scanning Electron Microscopy (1981)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 10 (1981), S. 153-153 
    Details
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/xrs.1300100314
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 4
    Electronic Resource
    Electronic Resource
    A Gaussian expression to describe φ(ρz) curves for quantitative electron probe microanalysis (1981)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 10 (1981), S. 138-146 
    Details
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: It is shown that the depth distribution of X-ray production in the electron microprobe can be accurately described by a Gaussian modified at the sample surface by a transient. Assuming that the Gaussian is a consequence of the electrons undergoing a random walk in the sample and that the transient corresponds with the change from collimated to random electron trajectories enables theoretical values for the amplitudes and coefficients of the two functions to be predicted. There is excellent agreement between the predicted and the observed values. The Lenard coefficient and the electron range can both be estimated from the coefficient in the Gaussian. It is suggested that for microprobe work, Lenard's law for electron absorption be replaced by this revised law. Both the absorption and atomic number corrections of the traditional ZAF approach are replaced by the new function.
    Additional Material: 14 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/xrs.1300100311
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 5
    Electronic Resource
    Electronic Resource
    X-ray production as a function of depth for low electron energies (1976)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 5 (1976), S. 36-40 
    Details
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Depth distributions of X-ray production by electrons in the energy range of six to fifteen key have been measured for Si and Cu characteristic X-rays in matrices of Al, Ni, Ag and Au. Corrections from these curves show that the modified Philibert absorption correction predicts the wrong dependence on matrix atomic number at these low electron energies, while the Duncomb and Reed atomic number correction shows too strong a dependence on atomic number. The curves should be valuable for comparison with both theoretical and empirical models for quantitative analysis at low energies.
    Additional Material: 4 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/xrs.1300050109
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 6
    Electronic Resource
    Electronic Resource
    Fire hazards of organic materials - small scale assessment of flammability and smoke generation (1976)
    New York, NY [u.a.] : Wiley-Blackwell
    Fire and Materials 1 (1976), S. 2-8 
    Details
    ISSN: 0308-0501
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Architecture, Civil Engineering, Surveying , Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: The flammability and smoke generation properties of a number of organic materials used in ships, including laminated materials, rigid and flexible cellular polymers, cable insulting materials and adhesives, have been evaluated. The relative flammabilities were determined by the limiting oxygen index method that gives convenient, reproducible, numerical ratings of materials. Smoke generation was assessed photometrically by measuring light attenuation under standard conditions and is reported in terms of the total amount of smoke generated, as well as the times for the smoke density to reach an arbitrary ‘critical’ level and the maximum value. Materials with low flammability and low smoke generation characteristics have been identified, as well as those that would be hazardous in the event of a fire.
    Additional Material: 5 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/fam.810010103
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 7
    Electronic Resource
    Electronic Resource
    Conference reports (1977)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 6 (1977), S. xi 
    Details
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/xrs.1300060112
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 8
    Electronic Resource
    Electronic Resource
    The atomic number and absorption corrections in electron microprobe analysis at low electron energies (1978)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 7 (1978), S. 26-30 
    Details
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: From an extensive series of measurements of φ(ρz) curves, at electron energies between 6 and 15 KeV, an empirical formula;φ(R)=DKn(KR)n-1 exp(-(KR)n) where R=ρz+ρzo, was developed to accurately describe the shape and magnitude of the measured curves. On the basis of this equation a quantitative correction for absorprion and atomic mumber effects has been derived for low electron energies. A comparision of quantitative analysis using the above equation wit other absorption and atomic number corrections shows better agreement between calculated and known concenequation to a correction for fluorescence due to characteristic lines is outlined.
    Additional Material: 8 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/xrs.1300070109
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 9
    Electronic Resource
    Electronic Resource
    Quantitative electron probe microanalysis using Gaussian φ(ρz) Curves (1982)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 11 (1982), S. 187-193 
    Details
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The Gaussian expression for φ(ρz) has been used as the basis of a computer program for quantitative electron probe microanalysis. Corrections for absorption and atomic number are combined within the expression for φ(ρz) whereas the fluorescence correction is based on numerical integration over the primary and secondary intensities. Error histograms based on about 500 published analyses of standard specimens have been used to adjust the parameters in the Gaussian expression for optimum accuracy. The resultant error histograms are as narrow as those obtained for the most accurate of the current ZAF correction procedures. Extension of the method to non-normal electron incidence is relatively straightforward.
    Additional Material: 6 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/xrs.1300110411
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 10
    Electronic Resource
    Electronic Resource
    Letter to the editor (1976)
    New York, NY [u.a.] : Wiley-Blackwell
    Fire and Materials 1 (1976), S. 83-84 
    Details
    ISSN: 0308-0501
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Architecture, Civil Engineering, Surveying , Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/fam.810010209
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
Close ⊗
This website uses cookies and the analysis tool Matomo. More information can be found here...