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  • 1
    Electronic Resource
    Electronic Resource
    Springer
    Oxidation of metals 13 (1979), S. 245-254 
    ISSN: 1573-4889
    Keywords: high-purity aluminum thin films ; in situ electron microscopy ; in situ evaporation ; in situ oxidation
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Abstract The authors studied the oxidation of thin aluminum films free of oxide layers in situ prepared by evaporation directly in the electron microscope under ultra-high-vacuum conditions. The oxidation was realized at various temperatures (350–500°C) and at various oxygen pressures (1–10−3 Pa). The formation and growth of the amorphous and crystalline products have been studied.
    Type of Medium: Electronic Resource
    Library Location Call Number Volume/Issue/Year Availability
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  • 2
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    International Journal for Numerical Methods in Engineering 9 (1975), S. 563-580 
    ISSN: 0029-5981
    Keywords: Engineering ; Engineering General
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Mathematics , Technology
    Notes: The typical numerical problem associated with finite element approximations is a quadratic programming problem with linear equality constraints. When nodal variables are employed, the coefficient matrix of the constraint equations, [A], acquires a block-diagonal structure. The transformation from polynomial coefficients to nodal variables involves finding a basis for [A] and computing its inverse.Simultaneous satisfaction of completeness and C1 (or higher) continuity requirements establishes linear relationships among the nodal variables and precludes inversion of the basis by exclusively element-level operations.Linear dependencies among the constraint equations and among the nodal variables can be evaluated by the simplex method. The computational procedure is outlined.
    Additional Material: 1 Ill.
    Type of Medium: Electronic Resource
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