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  • 1
    Electronic Resource
    Electronic Resource
    γγ-Winkelkorrelationsmessungen an155Gd (1975)
    Springer
    The European physical journal 272 (1975), S. 257-261 
    Details
    ISSN: 1434-601X
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract Two Ge(Li) detectors were used to investigateγ transitions in155Gd produced by the decay of155Eu. Relative intensities were determined for the weak lines at 18.8, 26.5, 58.0, and 86.0 keV. Angular correlations for fourγ cascades were measured. As results, the mixing ratios of the 45.3 and 86.5 keVγ lines were determined, and it was shown that the sign of the mixing ratio is positive for theγ line at 18.8 keV and negative for the line at 60.0 keV. Spins 5/2 and 3/2 for the 86.5 and 105.3 keV levels, respectively, are consistent with the data, and spin 5/2 for the 105.3 keV level is inconsistent with it.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF01438017
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  • 2
    Electronic Resource
    Electronic Resource
    Spin values of the low lying nuclear levels of201Hg (1975)
    Springer
    The European physical journal 272 (1975), S. 351-354 
    Details
    ISSN: 1434-601X
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract Gamma-gamma directional correlations have been investigated for the cascades of 135-30 keV and 135-32 keV in201Hg from the decay of201Tl. A combination of NaI (Tl) and Si (Li) detectors was used for the experiments. Spin values ofI=1/2, 3/2 and 1/2 have been assigned to 1.58, 32.19 and 167.49 keV energy levels. In addition, the relative intensities of theγ rays have been measured with a Ge (Li) detector system. The results are 2.2±0.2, 2.2±0.2, 26.5±1.3, 1.6±0.1 and 100 for theγ rays of 30.60, 32.19, 135.34, 165.88 and 167.43 keV energies, respectively.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF01440860
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  • 3
    Electronic Resource
    Electronic Resource
    Dependence of the evaporation residue production on the excitation energy of the compound nucleus in the reaction40Ar+164Dy (1978)
    Springer
    The European physical journal 284 (1978), S. 431-432 
    Details
    ISSN: 1434-601X
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract With the velocity filter SHIP at the heavy ion accelerator UNILAC the energy dependence of the evaporation residues production in the reaction40Ar+164Dy was investigated. The results show a much smaller shift of the (204Po, xn) excitation functions with respect to theoretical predictions than has been reported by other authors.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF01422114
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  • 4
    Electronic Resource
    Electronic Resource
    Depth resolution in sputter profiling (1977)
    Springer
    Applied physics 13 (1977), S. 205-207 
    Details
    ISSN: 1432-0630
    Keywords: 79.20
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract The dependence of depth resolution on sputter depth due to various parameters is theoretically estimated. Comparison with experimental work of different authors shows the validity of the proposed model.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF00882481
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  • 5
    Electronic Resource
    Electronic Resource
    Evaluation of concentration-depth profiles by sputtering in SIMS and AES (1976)
    Springer
    Applied physics 9 (1976), S. 59-66 
    Details
    ISSN: 1432-0630
    Keywords: Depth analysis ; Sputtering ; Auger spectroscopy ; SIMS
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract Experimental requirements for a successful application of sputtering techniques for depth profiling are summarized. Evidence is given for the depth resolution expected from the sputtering process. Principles for the evaluation of the concentration-depth relation in SIMS and AES are discussed. Examples of both techniques demonstrate present possibilities for depth analysis.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF00901910
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  • 6
    Electronic Resource
    Electronic Resource
    Anwendung der quantitativen Augerelektronenspektroskopie (AES) auf dünne Oberflächenschichten (1979)
    Springer
    Microchimica acta 71 (1979), S. 65-74 
    Details
    ISSN: 1436-5073
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology
    Description / Table of Contents: Summary The basic equations of quantitative Auger electron spectroscopy are applied to thin, homogeneous layers and are examined with reference to the example of a Sn segregation layer on a Cu(III) surface by comparison with the results for the diffraction of low-energy electrons (LEED). By variation of the surface coverage it is possible to obtain directly the ratio of the mean free parts of the Auger electron from Auger transitions of various energies of the matrix element.
    Notes: Zusammenfassung Die Grundgleichungen der quantitativen Auger-Elektronenspektroskopie werden auf dünne, homogene Schichten angewendet und am Beispiel einer Sn-Segregationsschicht auf einer Cu(111)-Oberfläche durch Vergleich mit Ergebnissen der Beugung niederenergetischer Elektronen (LEED) überprüft. Durch Variation der Oberflächenbelegung ist es möglich, das Verhältnis der mittleren freien Weglängen der Augerelektronen aus Augerübergängen verschiedener Energien des Matrixelements unmittelbar zu erhalten.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF01197521
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  • 7
    Electronic Resource
    Electronic Resource
    Multiple scattering and energy loss of fast heavy ions in thin solid targets (1978)
    Springer
    The European physical journal 288 (1978), S. 125-131 
    Details
    ISSN: 1434-601X
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract Multiple scattering and energy loss of 1.2 MeV/u Ar, Kr, Xe and U ions have been measured in C, Al, Ag, Au and Bi targets of different thicknesses. The experimental half-widths of the angular distributions of multiple scattering agree within 15 per cent with the theory of Meyer, and of Sigmund and Winterbon. The experimental stopping powers are compared with semi-empirical values of Braune and Schwalm, and of Northcliffe and Schilling, agreement is noted within 15 and 20 per cent, respectively.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF01408641
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  • 8
    Electronic Resource
    Electronic Resource
    Alpha decay studies of very neutron deficient isotopes of Hf, Ta, W, and Re (1979)
    Springer
    The European physical journal 291 (1979), S. 53-70 
    Details
    ISSN: 1434-601X
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract Very neutron deficient isotopes in the Hf-Re region were produced by bombarding targets of107, 109Ag,nat, 108, 110Pd, and103Rh with58Ni accelerated by the linear accelerator UNILAC at GSI. After separation from the projectile beam by the velocity filter SHIP, the fusion products were implanted with their full recoil energy into a silicon surface barrier detector. The subsequent alpha decay of the implanted ions was measured with the same detector. In some of the experiments the evaporation residues were implanted into a position sensitive silicon surface barrier detector. With a newly developed position and time correlation technique parent daughter relationships, half lives, andα branching ratios of a large number of isotopes could be determined. In the investigated reactions the eleven new isotopes161–164Re,160W,157–161Ta, and156Hf could be identified. The measuredQ α values, half lives, and a branching ratios are discussed. Two new high energyα. transitions of (7,408±10) keV and (7,804±15) keV were also found with half lives of 2.7 ms and 0.52 ms, respectively.A tentative mass and atomic number assignment givesA=153–156 andZ=70–72. The energies of the excited isomeric states are between 2 MeV and 3 MeV. From the systematics of alpha ground state transitions in even nuclei a hindrance of 105 can be deduced for both transitions, possibly indicating orbital angular momenta on the order of 10ħ for the alpha emitting states. The isomers are proposed to belong to shell model isomers beyond146Gd.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF01415817
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  • 9
    Electronic Resource
    Electronic Resource
    Integrierte Netzplantechnik. O. Reichert. 1. Aufl. (1977). 214 S., 43 Abb., und 9 Tafeln, Verlag Chemie Weinheim, New York, Kunststoffeinband DM 38,- (1979)
    Weinheim [u.a.] : Wiley-Blackwell
    Materials and Corrosion/Werkstoffe und Korrosion 30 (1979), S. 89-89 
    Details
    ISSN: 0947-5117
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/maco.19790300120
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  • 10
    Electronic Resource
    Electronic Resource
    Oberflächenanalyse — Neue Wege zur Untersuchung von Eigenschaften metallischer Werkstoffe (1977)
    Springer
    Fresenius' Zeitschrift für analytische Chemie 285 (1977), S. 177-183 
    Details
    ISSN: 1618-2650
    Keywords: Oberflächenanalyse ; moderne Methoden für Eigenschaftsuntersuchungen
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology
    Description / Table of Contents: Zusammenfassung Es wird gezeigt, wie die modernen Methoden der Oberflächenanalyse für Eigenschaftsuntersuchungen, insbesondere in der Reinststoff-Forschung, eingesetzt werden können. Nach einem Überblick über die wichtigsten Verfahren (AES, ESCA, SIMS, ISS) zur Oberflächen- und Tiefenverteilungsanalyse werden an Beispielen aus Arbeiten des Autors mit der AES über Sprödbruch, Korngrenzenanreicherung, Oberflächensegregation, Diffusion und der Analyse von dünnen Schichten die verschiedenen Anwendungsmöglichkeiten erläutert.
    Notes: Abstract It is shown, how modern methods in surface analysis can be used for the determination of properties, especially in the field of high-purity metals research. After a brief review of the most important techniques (AES, ESCA, SIMS, ISS) for surface and in-depth analysis, some examples from the work of the author with AES on brittle fracture, grain boundary segregation, surface segregation, diffusion, and analysis of thin films demonstrate different problems in application.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF00453562
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