Electronic Resource
Copenhagen
:
International Union of Crystallography (IUCr)
Applied crystallography online
8 (1975), S. 225-225
ISSN:
1600-5767
Source:
Crystallography Journals Online : IUCR Backfile Archive 1948-2001
Topics:
Geosciences
,
Physics
Notes:
In general, the contrast width and the visibility of small defect clusters observable by TEM is strongly dependent on the orientation and thickness of the foil examined, and on the depth positions of the defects in the foil. This dependence is not well known quantitatively and is discussed here.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1107/S0021889875010333
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