Library

feed icon rss

Your email was sent successfully. Check your inbox.

An error occurred while sending the email. Please try again.

Proceed reservation?

Export
Filter
  • 1975-1979  (4)
Material
Years
Year
Keywords
  • 1
    Electronic Resource
    Electronic Resource
    Springer
    Applied physics 8 (1975), S. 185-198 
    ISSN: 1432-0630
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract After a brief outline of the present sputtering theory for a random solid, recent results of the sputtering yieldS for polycrystalline targets are discussed, in particular in view of the influence of the projectile mass and the bombarding angle. The angle dependence ofS at low bombarding energies, and results on the angular distribution of sputtered particles for oblique ion incidence point out necessary modifications of present sputtering theories with respect to the anisotropy of the collision cascades in the solid and the influence of the target surface. The energy distribution of the neutral particles ejected along the target normals is related to the theoretically predictedE −2-distribution of low energy recoils in the Recent mass spectrometric studies of postionized sputtered neutrals are discussed in view of the formation of sputtered molecules and the application of sputtered neutral mass spectroscopy for surface analysis. Finally, the paper deals with ion-induced surface effects on non-elementary sputtering targets, and the protracted removal of foreign atoms from a matrix.
    Type of Medium: Electronic Resource
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
  • 2
    Electronic Resource
    Electronic Resource
    Springer
    Applied physics 14 (1977), S. 43-47 
    ISSN: 1432-0630
    Keywords: 79.20 ; 82.65
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract An experimental system for mass spectrometry of supttered neutral particles involving a hf plasma operated in Ar at several 10−4 Torr is described. The potentialities of the method for quantitative surface analysis are reasoned. Depth profiling by sputtered neutral mass spectrometry is demonstrated for anodic oxide layers on Nb and Ta.
    Type of Medium: Electronic Resource
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
  • 3
    Electronic Resource
    Electronic Resource
    Springer
    Applied physics 20 (1979), S. 55-60 
    ISSN: 1432-0630
    Keywords: 79.20 Nc
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract An arrangement for sputter-depth profiling by means of a low pressure hf plasma is described. Extremely plane bombarding craters are obtained when the bombarding voltage, the plasma parameters and the geometry of the target assembly are fitted appropriately. A quantitative relation for plane crater conditions is established, and verified by a comparison with crater profiles created in Ta2O5 layers by the bombardment with Ar+ ions of 100–600 eV. Under optimum conditions the flatness of the crater bottoms being investigated by optical interferometry was in the order of 10Å. The method has been applied for depth profiling of 3500Å thick Ta2O5 layers by Sputtered Neutral Mass Spectrometry (SNMS).
    Type of Medium: Electronic Resource
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
  • 4
    Electronic Resource
    Electronic Resource
    Springer
    The European physical journal 22 (1975), S. 41-48 
    ISSN: 1434-6036
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract The flux of neutral particles sputtered from clean polycrystalline targets of 11 metals has been studied by mass spectrometry after being postionized in a low pressure hf plasma. Besides atoms Me1, postionized metal molecules Me2 and Me3 have been detected. The energyE 0 of the bombarding Ar+ ions has been varied between 100 and 1000 eV. Considering the different plasma influences, an attempt is made to obtain the initial composition of the beam of sputtered neutrals from the ratiosR 21 andR 31 of postionized molecules Me2 and Me3 to postionized atoms, Me1, respectively. The influence of the bombarding energyE 0 onR 21 has been measured for all target elements, onR 31 for Pd and Ag. The yields of Me2 atE 0=1 keV approximately appear to be proportional to the square of the total sputtering yieldS for the different target materials. This behaviour and the energy dependence ofR 21 andR 31 are discussed in view of a possible molecule formation process in sputtering.
    Type of Medium: Electronic Resource
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
Close ⊗
This website uses cookies and the analysis tool Matomo. More information can be found here...