Electronic Resource
Copenhagen
:
International Union of Crystallography (IUCr)
Applied crystallography online
11 (1978), S. 229-233
ISSN:
1600-5767
Source:
Crystallography Journals Online : IUCR Backfile Archive 1948-2001
Topics:
Geosciences
,
Physics
Notes:
The profile-fitting method was used to analyze data, collected at speeds up to 1° (2θ) per second with a computer-controlled diffractometer, which gave precise values of intensities and angles of reflections above a selected intensity threshold level. Powder diffraction data with 52 reflections in a 40° range were collected and analyzed in a few minutes. This technique has also been applied to X-ray fluorescence spectroscopy, and is applicable to single-crystal diffractometry and wavelength-dispersive electron microprobe analysis.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1107/S0021889878013217
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