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  • 1970-1974  (3)
  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 30 (1974), S. 600-601 
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: The thickness fringes of a silicon wedge at the Bragg positions for 111 and 222, and at the symmetric position for hhh were observed with the electron microscope at 100 and 392 kV. The ratios of the measured fringe distances were analysed by the many-beam dynamical theory in electron diffraction assuming the theoretical values for the structure factors of orders higher than 333. As the result, the crystal structure factors are derived as F111 = 59.87 ± 0.46 and F222 = - 1.85 ± 0.85 at 293 °K.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 3 (1970), S. 74-89 
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: Diffraction phenomena in diametrically compressed single-crystal plates of silicon were systematically studied by topographic methods of the traverse and section types with Cu, Mo and Ag radiations. Black and white contrasts in the traverse topographs depend on the magnitude of the strain gradient, absorption, the sign and the order of the reflection vector, and the crystallographic orientations of the specimens. The results were interpreted in terms of the diffraction theory for a constant strain gradient. The distribution of the strain gradient was calculated under the assumptions of plane stress and isotropic elastic constants. Qualitative agreement was obtained between the theory and experiments. The behaviour of the contrast, including the departure from Friedel's law, is due to Borrmann absorption in distorted crystals. The quantitative discrepancy is explained by anisotropy of the elastic constants. The departure from a constant strain gradient is detectable by the asymmetry of the intensity distribution in section topographs.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 3 (1970), S. 404-405 
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: In X-ray diffraction topographs for nearly perfect crystals including a local heavy distortion, an anomalous beam was sometimes observed outside the ordinary section topograph. Experimentally, it was confirmed that the beam is due to the Bragg reflection of Kα2 and continuous components included in the incident radiations.
    Type of Medium: Electronic Resource
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