ISSN:
1573-4803
Source:
Springer Online Journal Archives 1860-2000
Topics:
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
Notes:
Abstract A detailed scanning electron microscopy study has been made of spherulites in meltcrystallized polyethylene. In particular, unetched, ion etched, nitric acid etched and plastically deformed polyethylene samples have been examined. It appears that the spherulites visible on the surface of these samples consist of lamellae which possess alternate right- and left-handed partial twists. It is quite possible that enough material was removed from the surfaces of the samples by ion etching that the spherulites visible on etched samples could be representative of bulk samples. While questions remain both about the half twist model and about the current full twist model, the half twist model deserves consideration as an alternate model for spherulite structure.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/BF00632757
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