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  • 1970-1974  (1)
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    Electronic Resource
    Electronic Resource
    Springer
    Journal of materials science 7 (1972), S. 105-114 
    ISSN: 1573-4803
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Abstract X-ray diffraction techniques have been used to study plastic deformation in a polycrystalline Ag-30 at.% Cd alloy under tensile load. The positions and shapes of all (hkl) reflections were recorded using a parafocusing arrangement up to a maximum true strain of 0.265. The effects on the peak displacements caused by stacking faults and by macroscopic strains normal to the surface were distinguished. The longitudinal true stress in the surface layer evaluated by least square analysis was smaller than the macroscopic flow stress by an approximately constant amount over the whole range of strain (in accord with previous observations of a stress gradient near a free surface); the apparent rate of work hardening in the surface was equal to that for the specimen as a whole. The stacking fault probability α was approximately a linear function of strain and attained a maximum value of 7×10−3. Fourier analyses were performed on the profiles of (111) — (222) and (200) — (400) pairs of reflections. The effective particle sizes D e(111) and D e(100) and the estimated true domain size D decreased approximately inversely with increasing strain, tending to limiting values at high strains of 220, 150 and 300Å respectively. Similarly, the microscopic strains [〈εL 2〉hkl *]1/2 tended to limiting values at high mechanical strains. The twin fault concentration was found to be negligibly small. The particle size and microstrain parameters were compared with values for cold-worked filings of the alloy. A plot of α against 〈εL=50Å 2〉111 * for the solid specimens and for the filings was linear and yielded a stacking fault energy for Ag-30 at. % Cd of 6.1 ergs/cm2.
    Type of Medium: Electronic Resource
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