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  • Polymer and Materials Science  (37)
  • 21.10.Dr  (2)
  • 11.30.er  (1)
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  • 1
    Electronic Resource
    Electronic Resource
    Production and decay of269110 (1995)
    Springer
    The European physical journal 350 (1995), S. 277-280 
    Details
    ISSN: 1434-601X
    Keywords: 21.10.Dr ; 23.60.+e ; 25.70.−z ; 27.90.+b
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract In an experiment carried out to identify element 110, we have observed anα-decay chain, that can be unambiguously assigned to269110. In a scries of preexperiments the excitation functions of the fusion reactions50Ti +208Pb→258104* and58Fe +208Pb→266108* were measured with high precision in order to get the optimum projectile energies for the production of these heavy elements. The cross-section maxima of the 1n evaporation channels were observed at excitation energies of 15.6 MeV and 13.4 MeV, respectively. These data result in an optimum excitation energy of 12.3 MeV of the compound nucleus for the production of269110 in the reaction62Ni +208Pb→269110 + 1n. In irradiations at the corresponding beam energy of 311 MeV we have observed a decay chain of 4 subsequent a decays. This can be assigned to the isotope with the mass number 269 of the element 110 on the basis of delayed α-α coincidences. The accurately measured decay data of the daughter isotopes of the elements 108 to 102, obtained in the previous experiments, were used. The isotope269110 decays with a hair-life of (270 -120 +1300 ) μs by emission of (11.132±0.020) MeV alpha particles. The production cross-section is (3.3 -2.7 +6.2 ) pb.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF01291181
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  • 2
    Electronic Resource
    Electronic Resource
    The new element 111 (1995)
    Springer
    The European physical journal 350 (1995), S. 281-282 
    Details
    ISSN: 1434-601X
    Keywords: 21.10.Dr ; 23.60.+e ; 25.70.−z ; 27.90.+b
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract The new element 111 was produced and unambiguously identified in an experiment at SHIP, GSI Darmstadt. Three nuclei of the isotope272111 were observed in irradiations of209Bi targets with64Ni projectiles of 318 MeV and 320 MeV energy. The cross-sections are (1.7 −1.4 +3.3 ) pb and (3.5 −2.3 +4.6 ) pb, respectively. The nuclei decay by a emission into the new and so far the heaviest isotopes of the elements 109 and 107 with mass numbers A=268 and A=264. Theα-decay chains were followed down to the known nuclei260105 and256Lr.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF01291182
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  • 3
    Electronic Resource
    Electronic Resource
    Parity violation in the 17/2− isomer of93Tc (1990)
    Springer
    The European physical journal 336 (1990), S. 133-138 
    Details
    ISSN: 1434-601X
    Keywords: 11.30.er ; 23.20.Js ; 29.75. + X
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract The parity-violating mixing of the 17/2− and 17/2+ levels in93Tc nuclei, polarized by the tilted multifoil interaction, was measured by the observation of the forwardbackwardγ-ray asymmetry. The asymmetry was determined to beA γ=1.18(48)×10−3. The nuclear polarization was determined in a measurement of the quadrupole interaction in a92Mo isomer and the parity violation matrix element 〈H PV〉 is found to be ¦〈H PV〉¦ =0.8(4) meV.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF01290613
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  • 4
    Electronic Resource
    Electronic Resource
    Charakterisierung keramischer Werkstoffe mit der Auger-Elektronenspektroskopie: Möglichkeiten und Grenzen (1990)
    Weinheim : Wiley-Blackwell
    Materialwissenschaft und Werkstofftechnik 21 (1990), S. 93-104 
    Details
    ISSN: 0933-5137
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Description / Table of Contents: Understanding the relationships between mechanical and other physico-chemical properties and the microstructural chemistry is a necessity for a well-controlled development of new materials. A prerequisite for the achievement of this goal is an advanced microanalytical characterization, which can be obtained by application of surface analysis methods. Among these, high resolution Auger electron spectroscopy (HR-AES or Scanning Auger Microscopy, SAM) has proved to be extremely useful for surface, interface and depth profile analysis of ceramic materials. After a short presentation of the principles and the main areas of application, specific advantages are discussed for some examples. Those are e.g. a depth of information in the nanometer range, a sub-micrometer lateral resolution, a relatively high detection sensitivity for the light elements like B, C, N, O, and a small matrix effect in quantitative analysis. The main disadvantages are due to a variety of detrimental electron beam induced effects which are outlined for some examples of oxide and non-oxide ceramics. The generation of electrical charging of insulating ceramics and its avoidance or reduction by appropriate experimental procedures is particularly emphasized.
    Notes: Das für eine kontrollierte Materialentwicklung benötigte Verständnis des Zusammenhangs zwischen mechanischen und anderen physikalisch-chemischen Eigenschaften und dem mikrostrukturellen Aufbau setzt eine leistungsfähige mikroanalytische Charakterisierung voraus, die vor allem durch den Einsatz oberflächenspezifischer Untersuchungsverfahren erhalten werden kann. Unter diesen hat sich insbesondere die hochauflösende Auger-Elektronenspektroskopie (High Resolution Auger-Electron Spectroscopy, HR-AES bzw. Scanning Auger Microscopy, SAM) in Verbindung mit Oberflächen-, Bruchflächen- und Tiefenprofilanalysen bewährt, deren Grundlagen und Haupteinsatzgebiete unter besonderer Berücksichtigung keramischer Werkstoffe vorgestellt werden. Den Vorteilen kleiner Informationstiefe im Nanometerbereich, der hohen Ortsauflösung im Sub-Mikrometer-Bereich, der vergleichsweise hohen Nachweisempfindlichkeit für leichte Elemente wie B, C, N, O sowie der geringen Matrix-Effekte bei der quantitativen Analyse stehen als Nachteile eine Reihe störender elektronenstrahlinduzierter Effekte gegenüber. Diese werden anhand ausgewählter Beispiele für oxidische- und nichtoxidische Keramiken erläutert, wobei besondere Betonung auf die Entstehung von elektrischen Aufladungen bei nichtleitenden Keramiken und deren Vermeidung bzw. Verminderung durch geeignete experimentelle Maßnahmen gelegt wird.
    Additional Material: 14 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/mawe.19900210302
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  • 5
    Electronic Resource
    Electronic Resource
    Reibung und Verschleiß. Mechanismen - Prüftechnik - Werkstoffeigenschaften. Hrsg. K.-H. Zum Gahr. 244 S., zahlr. Abb. Alphabetisches Stichwortverzeichnis. DGM Informationsgesellschaft mbH, Oberursel 1983. Geb., 16 × 23,5 cm. ISBN 3-88355-064-7. DM 87,- (1984)
    Weinheim [u.a.] : Wiley-Blackwell
    Materials and Corrosion/Werkstoffe und Korrosion 35 (1984), S. 318-318 
    Details
    ISSN: 0947-5117
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/maco.19840350608
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  • 6
    Electronic Resource
    Electronic Resource
    Augerspektroskopische Untersuchungen zur Lochkorrosion von Fe-Cr-, Fe-Mo- und Fe-Cr-Mo-LegierungenHerrn Professor Dr. K. E. Heusler zum 60. Geburtstag gewidmet (1991)
    Weinheim [u.a.] : Wiley-Blackwell
    Materials and Corrosion/Werkstoffe und Korrosion 42 (1991), S. 169-178 
    Details
    ISSN: 0947-5117
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Description / Table of Contents: Auger-spectroscopic investigations into pitting corrosion of FeCr, FeMo and FeCrMo alloysA single pit was produced on binary iron-chromium (Fe17Cr), iron-molybdenum (Fe1Mo, Fe3Mo, and Fe5Mo) and ternary iron-chromium-molybdenum alloys (Fe17CrxMo, x = 1, 3, 7 wt.%) in 0.5 M H2SO4 with Cl- additions (0.02 to 0.08 molar) at room temperature. Compositional changes at the bottom of the pit and in the surrounding passive film were determined using high resolution Auger-Electron Spectroscopy (AES). The chromium and molybdenum content of the passive layers are not changed in the presence of Cl- and there is no incorporation of chlorine in the passive film as long as the films were formed in a chlorine-free electrolyte and Cl- was added later. At the bottom of the pits salt films could be determined in all cases after removing the electrolyte with filter paper. These salt films are strongly enriched in chromium, molybdenum and chlorine. The salt film was not detectable for Fe-Cr after rinsing the samples with distilled water, whereas in the case of molybedenum additions the salt film could not be washed away with water.
    Notes: Ein einzelnes Loch wurde auf der passiven Oberfläche von Eisen-Chrom-(Fe17Cr), Eisen-Molybdän-(Fe1Mo, Fe3Mo und Fe5Mo) und ternären Eisen-Chrom-Molybdän-Legierungen (Fe17CrxMo, x = 1, 3, 7 Gew.%) durch Lochkorrosion in 0,5 M H2SO4 mit Cl--Zusätzen von 0,02 und 0,08 Mol/l bei Raumtemperatur erzeugt. Die Zusammensetzung des Lochbodens und der umgebenden Passivschicht wurde mit Hilfe der hochauflösenden Augerelektronenspektroskopie (AES) bestimmt. Der Chrom- und Molybdängehalt des Passivfilmes wird durch die Anwesenheit der Cl--Ionen nicht verändert, und es wird kein Chlor in den Passivfilm eingebaut, solange der Film in chloridfreiem Elektrolyt gebildet und Cl- später zugesetzt wurde. Auf dem Lochboden konnten in allen Fällen Salzfilme festgestellt werden, nachdem der Elektrolyt mit Filterpapier aufgesogen wurde. Diese Salzfilme waren stark mit Chrom, Molybdän und Chlor angereichert. Bei der Fe-Cr-Legierung konnte der Salzfilm nach Spülung mit Wasser nicht mehr nachgewiesen werden, während bei den molybdänhaltigen Legierungen der Salzfilm mit Wasser nicht entfernt werden konnte.
    Additional Material: 12 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/maco.19910420405
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  • 7
    Electronic Resource
    Electronic Resource
    Oxidation behavior of CrNx and (Cr,Al)Nx hard coatings (1990)
    Weinheim [u.a.] : Wiley-Blackwell
    Materials and Corrosion/Werkstoffe und Korrosion 41 (1990), S. 756-760 
    Details
    ISSN: 0947-5117
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Description / Table of Contents: Oxidationsverhalten von Hartstoffschichten aus CrNx und (Cr,Al)NxDurch reaktives Magnetron-Sputtering hergestellte Nitrid-Hartstoffschichten aus CrNx und (Cr,Al)Nx wurden in Luft bei Temperaturen zwischen 500°C und 900°C bis zu 16 Stunden lang oxidiert. Ursprüngliche und oxidierte Proben wurden durch Auger-Elektronenspektroskopie, Rasterelektronenmikroskopie und Röntgenbeugung untersucht. Die Ergebnisse zeigen, daß die Oxidation von Beschichtungen aus CrNx durch das Wachstum einer Chromoxidschicht gekennzeichnet ist, das durch Diffusion von Cr aus der Nitridschicht bestimmt wird. Unterhalb der Oxidschicht entsteht eine an Cr verarmte und mit N angereicherte Schicht. Beschichtungen mit dem ternären (Cr,Al)Nx sind bei allen Temperaturen zwischen 500°C und 900°C etwa fünfmal mehr oxidationsbeständig, als solche aus CrNx. Die Oxidschicht auf (Cr,Al)Nx zeigt eine ausgeprägte Variation der Zusammensetzung mit der Tiefe. Diese kann im wesentlichen durch das Vorherrschen einer äußeren Cr-reichen (Cr,Al)-Oxidschicht gedeutet werden, die sich nach innen zu in einer Al-angereicherten (Cr,Al)-Oxynitridschicht fortsetzt. Im Gegensatz zu CrNx findet man eine breite Interdiffusionszone von N und O. In beiden Fällen wird der Oxidationsvorgang hauptsächlich durch die Diffusion von Cr bestimmt.
    Notes: Reactively magnetron-sputtered CrNx and (Cr,Al)Nx hard costings were oxidized in air at temperatures between 500°C and 900°C for periods up to 16 h. The original and the oxidized samples were characterized by scanning electron microscopy, X-ray diffraction and scanning Auger electron spectroscopy. The results show that CrNx coatings oxidize by growth of chromium oxide layer on top of the coating governed by outward diffusion of Cr. Below the oxide layer, a Cr-depleted and N-enriched intermediate nitride layer is left. The ternary (Cr,Al)Nx nitride coating is about five times more oxidation resistant than CrNx at all temperatures between 500°C and 900°C. The oxide layer on (Cr,Al)Nx shows a strong variation in composition with depth, which can be interpreted as a main oxide layer of a Cr-rich (Cr,Al) oxide followed by an Al-enriched (Cr,Al) oxynitride. In contrast to CrNx, a wide interdiffusion zone of N and O is found. In both cases the oxidation process is mainly controlled by Cr diffusion.
    Additional Material: 5 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/maco.19900411222
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  • 8
    Electronic Resource
    Electronic Resource
    Integrierte Netzplantechnik. O. Reichert. 1. Aufl. (1977). 214 S., 43 Abb., und 9 Tafeln, Verlag Chemie Weinheim, New York, Kunststoffeinband DM 38,- (1979)
    Weinheim [u.a.] : Wiley-Blackwell
    Materials and Corrosion/Werkstoffe und Korrosion 30 (1979), S. 89-89 
    Details
    ISSN: 0947-5117
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/maco.19790300120
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  • 9
    Electronic Resource
    Electronic Resource
    Quantitative depth profiling in surface analysis: A reviewInvited paper presented at the International Conference on Quantiative Surface Analysis, Teddington, UK, 16-17 october 1979. (1980)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 2 (1980), S. 148-160 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: After a brief survey of the various non-destructive and destructive methods used for obtaining in-depth composition profiles, the generally applicable method of ion sputtering in combination with a surface analysis technique is discussed in more detail. The quantitative evaluation of sputtering profiles requires the conversion of a measured signal intensity versus sputtering time into a true concentration versus distance from the original surface. Basically, this procedure comprises the quantification of the surface analysis method applied and the sputtering rate, both being dependent on sample composition. Furthermore, various phenomena limit the quantitative evaluation of depth profiles; the most important of which are ion and/or electron beam induced changes of surface composition and surface microtopography. Different factors such as information depth, ion beam inhomogeneity, original and beam induced roughness, knock-on and atomic mixing effects, preferential sputtering, enhanced atomic migration etc. are discussed with respect to their influence on depth resolution and its dependence on sputter depth. Model calculations and their comparison with experimental data reveal the influence of these factors. In conclusion, the basic requirements for the optimization of sputter profiling are stated.
    Additional Material: 19 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740020406
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  • 10
    Electronic Resource
    Electronic Resource
    Crater edge profling of Ni/Cr sandwich multilayer thin films by scanning Auger microscopy (sam) (1980)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 2 (1980), S. 183-186 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The principle of the technique of crater edge profiling is described as an alternative method to conventional sputter profiling. The predictions for the lateral composition profile assuming a Gaussian intensity distribution of the primary ion beam are tested for a multilayer sandwich structure of Ni/Cr layers of 11.5 nm single layer thicknesses after Ar+ ion sputtering through 20 layers and scanning Auger microscopy with a 10 µm diameter electron beam. Due to the small angle of 44.3″ of the slope of the crater formed by ion sputtering, a magnification factor (lateral variation/depth variation) of 5 × 103 is obtained.
    Additional Material: 5 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740020506
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