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Threshold photoelectrons coincidence spectroscopy of the rare gases Ne, Ar, Kr and Xe (1992)

Hall, R. I. ; Dawber, G. ; McConkey, A. G. ; [weitere]

Springer

The European physical journal 23 (1992), S. 377-381

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Details

ISSN: 1434-6079

Schlagwort(e): 32.80.Fb

Quelle: Springer Online Journal Archives 1860-2000

Thema: Physik

Notizen: Abstract Threshold single photon double ionisation of the rare gases neon, argon, krypton and xenon has been studied in an electron-electron coincidence experiment. A new technique has been used where only near-zero energy electrons are detected and these are measured in coincidence. The spectrometer used here employs the penetrating field technique which provides very high detection efficiency, sensitivity and energy resolution. Relative partial double ionisation cross sections have been measured at threshold for then p4(3P,1D and1S) states of Ne++, Ar++, Kr++ and Xe++ and then sn p5 (3P and1P) states of Ne++, Ar++ and Kr++. The observed relative cross sections are in general agreement with a propensity rule for excitation of these states, except for the case of neon.

Materialart: Digitale Medien

URL: http://dx.doi.org/10.1007/BF01429261

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