Electronic Resource
Springer
The European physical journal
12 (1989), S. 303-305
ISSN:
1434-6079
Keywords:
36.40
;
34.80.G
Source:
Springer Online Journal Archives 1860-2000
Topics:
Physics
Notes:
Abstract Electron attachment and electron impact ionization of SF6 clusters have been investigated quantitatively in a molecular beam/electron ion source/mass spectrometer system as a function of electron energy E (0≤E≤180 eV) and as a function of cluster size.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/BF01426962
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