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  • 34.80.Gs  (2)
  • Analytical Chemistry and Spectroscopy  (1)
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  • 1
    Electronic Resource
    Electronic Resource
    Springer
    The European physical journal 3 (1986), S. 319-322 
    ISSN: 1434-6079
    Keywords: 36.40.+d ; 34.80.Gs ; 35.20.Wg
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract Multiply charged ammonia cluster ions are produced by adiabatic nozzle expansion and subsequent ionization by electron impact. They are analyzed in a double focussing sector field mass spectrometer (reversed geometry). Doubly charged clusters are only detected above a critical size of 51 and triply charged clusters above 121. Some of these multiply charged ions decay via metastable dissociation processes in the experimental time window accessible. Doubly charged ammonia clusters with sizes ofn≧51 lose one neutral monomer or, roughly ten times less probable, two neutral monomers. Conversely, triply charged ammonia clusters with sizes 110≦n≦120 show an extremely asymmetric Coulomb dissociation resulting in doubly charged cluster ions of about 90% of the initial mass
    Type of Medium: Electronic Resource
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  • 2
    ISSN: 1434-6079
    Keywords: 34.80.Gs ; 35.20.Wg
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract Electron impact ionization of propane (C3H8) was studied using the ion beam deflection technique and a double focussing mass spectrometer in conjunction with a recently developed correction procedure that accounts for discrimination due to the initial kinetic energy of fragment ions. The relative corrected partial ionization cross sections for the production of C3H 8 + , C3H 7 + , C3H 6 + , C3H 5 + , C3H 4 + , C3H 3 + , C3H 2 + , C3H+, C 3 + ; C2H 5 + , C2H 4 + , C2H 3 + , C2H 2 + , C2H+, C 2 + ; CH 3 + , CH 2 + , CH+, C+; C3H 5 2+ , C3H 4 2+ , C3H 3 2+ and C3H 2 2+ were determined from threshold up to 950 eV. Absolute partial ionization cross sections were obtained by charge weighted summing of all the observed partial ionization cross sections and by normalizing to a recent accurate determination of the total ionization cross section at 100 eV by Djuric et al. 1991. The absolute total ionization cross section curve obtained is in excellent agreement in shape and magnitude with the low energy data (〈200 eV) of Djuric et al. 1991 and the high energy data points of Schram et al. 1966.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    New York, NY : Wiley-Blackwell
    Rapid Communications in Mass Spectrometry 5 (1991), S. 51-57 
    ISSN: 0951-4198
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: A review of mass spectrometric methods used to study different kinds of clusters is presented. These methods have proved to be indispensable in the cluster field owing to their great flexibility, sensitivity and wide dynamic range. This reviews presents new mass spectrometric methods and techniques such as quadrupole analysers and RF lenses, different ion-trap geometries, time-of-flight (TOF) methods including the reflectron geometry). A variety of ionization methods, both for the production of positive and negative ions, with different amounts of released excess energy, are discussed in detail. Special attention is given to different degree of post-ionization fragmentaqtion and metastability of ions produced by the respective ionization methods. The ability to follow the metastable decay processes in rather different time-windows is also one of the salient features of the mass spectrometric methods reviewed here, involving both classical and new geometries. Detection of very large cluster ions by conventional methods is not always effective, and alternative methods like post-acceleration and using a conversion dynode in front of the multiplier will be included here. Moreover, mass spectrometric methods offer the possibility of producing beams of mass-selected cluster ions necessary for the study of a whole line of process like optical spectrometry, photodetachment, photofragmentation, photoionization, electron beam ionization, and charge-exchange processes. Examples of these processes are also discussed in this review.
    Additional Material: 6 Ill.
    Type of Medium: Electronic Resource
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