Library

feed icon rss

Your email was sent successfully. Check your inbox.

An error occurred while sending the email. Please try again.

Proceed reservation?

Export
Filter
  • 61.16.Di  (1)
  • PACS. 61.16.Bg Transmission, reflection and scanning electron microscopy (including EBIC) - 81.05.Tp Fullerenes and related materials; diamonds, graphite  (1)
  • 1
    ISSN: 1434-6036
    Keywords: PACS. 61.16.Bg Transmission, reflection and scanning electron microscopy (including EBIC) - 81.05.Tp Fullerenes and related materials; diamonds, graphite
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract: Various filled carbon nanotubes have recently been successfully produced by the arc-discharge method by doping a 99.4% graphite anode with a transition metal like Cr, Ni, a rare earth like Yb, Dy, or a covalent element like S, Ge. In this work, the structural characteristics of these encapsulated nanowires were studied by High Resolution Transmission Electron Microscopy and their chemical composition was investigated using Electron Energy-Loss Spectroscopy with high spatial resolution: this analysis mode provides elemental concentration profiles across or along the filled nanotubes. Except in the case of Ge for which only pure Ge fillings were identified, surprising amounts of sulfur, which was present as an impurity ( 0.25%) in the graphite rods, were found within numerous filling materials. When using high purity carbon rods, no filled nanotube was obtained. We chose the case of Cr to clearly evidence that the addition of sulfur in catalytic quantity is responsible for the formation of filled nanotubes, including sulfur free encapsulated nanowires. A growth mechanism based on a catalytic process involving three elements, i.e. carbon, a metal and sulfur, and taking into account the experimental results is proposed.
    Type of Medium: Electronic Resource
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
  • 2
    Electronic Resource
    Electronic Resource
    Springer
    The European physical journal 12 (1989), S. 333-339 
    ISSN: 1434-6079
    Keywords: 61.16.Di ; 71.45.Gm ; 79.20.H
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract The finely focused electron beam of a STEM microscope provides a very powerful probe for the investigation of the local chemical and electronic properties of small particles. After a general description of different techniques which have been developed to take benefit of the Electron Energy Loss Signal (EELS) in this configuration, we describe two experiments under progress. The first one concerns clusters of iron oxide particles in a magnetic superlattice, the second one deals with silicon spheres. These examples involve quite different excitations which are respectively more characteristic of the properties of the bulk (core loss edges) or of the surface (plasmon modes).
    Type of Medium: Electronic Resource
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
Close ⊗
This website uses cookies and the analysis tool Matomo. More information can be found here...