ISSN:
1432-0630
Keywords:
PACS: 61.46.+W
;
68.55.Jk
;
73.40.Lq
Source:
Springer Online Journal Archives 1860-2000
Topics:
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
,
Physics
Notes:
Abstract. Polycrystalline C60 films are deposited onto a variety of substrates by ionized cluster beam deposition (ICBD) technique. The structure of the ICBD C60 films are studied by transmission electron microscopy (TEM). The electrical characteristics of the ICBD C60 films on silicon substrates are investigated by current–voltage (I–V) measurements. The ICBD C60/p-Si and C60/n-Si heterostructures show strong current rectification, which is analyzed using band theory.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/s003390050398
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