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  • 1
    ISSN: 1090-6487
    Keywords: 74.80.Fp ; 74.50.+r
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract Normal (N) metallic (Ag) mesoscopic conductors with two superconducting (S) faces (Al), arranged mirror-symmetrically relative to the streamlines of the current, periodically switch into the normal state as the superconducting phase difference Δϕ between the NS boundaries approaches the values Δϕ =(2n+1)π, n=0,1,2,..., irrespective of temperature and applied voltage. For Δϕ =2nπ and low applied voltages the conductance passes through a maximum and approaches the normal value as temperature decreases (reentrance). As the voltage subsequently increases, the conductance increases and passes through a maximum. As the phase difference moves away from the values Δϕ=2nπ, the maxima shift in the direction of low temperatures and voltages. The latter result shows unequivocally that in our metal structures it is necessary to take into account the next-order corrections to the “weak” proximity effect approximation.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Springer
    Applied physics 66 (1998), S. 1223-1226 
    ISSN: 1432-0630
    Keywords: PACS: 74.70; 68.55; 61.16.Ch
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: 2 Ba2CuO6 films on single-crystal LaAlO3 was investigated using atomic force microscopy and X-ray diffraction. Most of the film surface consisted of flat areas separated by single or several unit-cell steps. This morphology suggests that the films grow predominantly by a step-flow mechanism. A Tl-2201 film grown using a precursor film deposited at 700 °C exhibited stacks of planes arranged in a screw-like manner on a flat background. Islands of 1–3 μm size and a height of 2–20 unit cells were dominant structures on the surface. Possible causes for the formation of the screw-like structures are discussed.
    Type of Medium: Electronic Resource
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