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Photothermal deflection spectroscopy of polymer thin films (1995)

So, S. K. ; Chan, M. H. ; Leung, L. M.

Springer

Applied physics 61 (1995), S. 159-161

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ISSN: 1432-0630

Keywords: 78.20.Dj ; 78.66.Qn

Source: Springer Online Journal Archives 1860-2000

Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics

Notes: Abstract Photothermal Deflection Spectroscopy (PDS) is known to be one of the most sensitive techniques for measuring the absorption of weakly absorbing materials. We have applied PDS for measuring the optical absorption of a few polymer thin-film samples over the wavelength region from 0.4–2.0 μm. The results are useful for optical evaluation of these polymers.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1007/BF01538383

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