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  • Chemical Engineering  (2)
  • Acousto-Optical Spectrometer  (1)
  • Anion-exchange  (1)
  • 1
    Electronic Resource
    Electronic Resource
    Amsterdam : Elsevier
    Comparative Biochemistry and Physiology -- Part B: Biochemistry and 108 (1994), S. 463-469 
    ISSN: 0305-0491
    Keywords: 21 kDa whey protein ; Anion-exchange ; FPLC ; Gel filtration ; Milk ; Reverse-phase chromatography ; Rhesus monkey
    Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
    Topics: Biology , Chemistry and Pharmacology
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Springer
    Experimental astronomy 9 (1999), S. 17-38 
    ISSN: 1572-9508
    Keywords: Radio Astronomy ; Array Systems ; Acousto-Optical Spectrometer ; Back-ends ; Radiometers ; Heterodyne Instrumentation
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract In this paper an array acousto-optical spectrometer (AOS) with four 1 GHz bands and a frequency channel spacing of 1 MHz is presented. A discussion about the requirements which have to be fulfilled by the presented instrument for applications in radio astronomy is given as well as e detailed description of the optical design. Remarkable test results have been achieved such as an Allan-Variance minimum time of about 1000 s, identical noise performance, and identical frequency calibration of all bands. The reproducibility of measurements has been demonstrated by tests with CH3CN, using an absorption cell. The question of the maximum number of bands per array AOS is discussed. Although it may seem promising to increase the number of bands per optical unit to e.g. eight or more instead of four, a strong limitation has been found due to the increasing r.f. power level on the Bragg cell which affects the baselines of the spectra.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    Stamford, Conn. [u.a.] : Wiley-Blackwell
    Polymer Engineering and Science 12 (1972), S. 109-111 
    ISSN: 0032-3888
    Keywords: Chemistry ; Chemical Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology , Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: A new method for removal of thin films of photoresist polymers has been found. When polymeric films are exposed to ultraviolet light in the presence of air, the material can be removed leaving an extremely clean surface, free of carbonaceous material. This process has been examined for a variety of photoresist polymers as well as on nonphotoresist polymers and on a variety of substrates. The process offers a new method of photoresist removal.
    Additional Material: 4 Ill.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    Stamford, Conn. [u.a.] : Wiley-Blackwell
    Polymer Engineering and Science 12 (1972), S. 209-212 
    ISSN: 0032-3888
    Keywords: Chemistry ; Chemical Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology , Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Polymeric films deposited from the vapor of C4Cl6 by the surface-photopolymerization technique are electrically and mechanically continuous on various substrates when very thin. The thickness of the films depends upon irradiation time with wavelengths in the region 2000-3000Å. Re-irradiation in oxygen (air) of the polymeric films with light of these low wavelengths leads to patterned removal of the films. Since films 500Å thick and less can resist etchants for various substrates, a new and extremely thin positive photoresist system is possible. Resolution of etched substrates to lines a few microns wide has been demonstrated. If the polymeric films from C4Cl6 are deposited from the monomeric vapor at lower substrate temperatures they are soluble in various solvents. Re-irradiation with UV light with the films in vacuum produces a patterned fixing of the polymer with respect to acetone. A negative photoresist system is therefore possible. Again, films of thickness 500Å and less can resist various etchants such that substrates can be etched to high resolution.
    Additional Material: 4 Ill.
    Type of Medium: Electronic Resource
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