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Indium antimonide as an X-ray monochromator (1975)

Gohshi, Y. ; Hirao, O. ; Murata, M. ; [weitere]

New York, NY [u.a.] : Wiley-Blackwell

X-Ray Spectrometry 4 (1975), S. 74-76

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Details

ISSN: 0049-8246

Schlagwort(e): Chemistry ; Analytical Chemistry and Spectroscopy

Quelle: Wiley InterScience Backfile Collection 1832-2000

Thema: Physik

Notizen: A single crystal of indium antimonide (zinc blende type InSb) was evaluated as an X-ray monochromator. The long 2d spacing of 7.481 Å makes it possible to diffract Si K α in an ordinary X-ray emission spectrometer. The indium antimonide data were compared with crystals of EDDT, Ge and LiF. Indium antimonide shows seven times higher Si Kα intensity than EDDT. It also has very low second order reflection. A low coefficient of thermal expansion (4.9 × 10-6 °C-1), together with its very stable chemical nature will facilitate high precision measurement ranging from 14Si to 46Pd(Kα), 38Sr to 92U(Lα) and 74W to 92U(Mα).

Zusätzliches Material: 8 Ill.

Materialart: Digitale Medien

URL: http://dx.doi.org/10.1002/xrs.1300040208

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