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  • 1
    Electronic Resource
    Electronic Resource
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 8 (1979), S. 146-148 
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Experimental measurements of the relative intensity of the escape peak produced in an intrinsic Ge detector agree quite well with the calculated intensities based on a theoretical model. Contrary to the Si(Li) detector Kα as well as Kβ escape peaks are observed. In the energy region 11-25 keV the Ge Kα escape peak intensities vary from 16.3 to 4.7% and the Ge Kβ escape peak from 2.4 to 0.9% of that to the parent line. Therefore, the escape peaks are not negligible in X-ray fluorescence analysis, and it may be necessary to numerically correct for them or, by a suitable choice of excitation energy, avoid them completely.
    Additional Material: 1 Ill.
    Type of Medium: Electronic Resource
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