ISSN:
0049-8246
Keywords:
Chemistry
;
Analytical Chemistry and Spectroscopy
Source:
Wiley InterScience Backfile Collection 1832-2000
Topics:
Physics
Notes:
The surface structure of silicon carbide whiskers, produced from rice husk at 1500-1800°C, was examined by x-ray photoelectron spectroscopy. An ESCA survey scan of the surface showed Si, C, O and F to be present; Si in the form of SiCx and SiOx and C in the form of SiCx and CHx. On sputtering the sample, the SiOx and CHx species were reduced and the SiCx level increased. The photoelectron spectra are presented.
Additional Material:
8 Ill.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1002/xrs.1300180507
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