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Substrate Effects and Chemical State Plots for the XPS Analysis of Supported TiO2 Catalysts (1997)

Jiménez, V. M. ; Lassaletta, G. ; Fernández, A. ; [weitere]

Chichester [u.a.] : Wiley-Blackwell

Surface and Interface Analysis 25 (1997), S. 292-294

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Details

ISSN: 0142-2421

Schlagwort(e): XPS ; Auger parameter ; TiO2 ; catalyst ; chemical state plot ; Chemistry ; Polymer and Materials Science

Quelle: Wiley InterScience Backfile Collection 1832-2000

Thema: Physik

Notizen: The analysis by XPS of TiO2 deposited on different substrates (SiO2, MgO, Ag, SnO) shows the existence of shifts in the Ti 2p binding energy and Auger parameter values. The magnitude of these shifts is a function of the support and of the coverage. A systematic representation of these shifts is possible with a chemical state plot. The implications of the existence of such shifts for the characterization of catalysts are discussed. © 1997 by John Wiley & Sons, Ltd.

Zusätzliches Material: 2 Ill.

Materialart: Digitale Medien

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