ISSN:
0887-6266
Keywords:
small angle x-ray scattering (SAXS) of distorted lamellar structures
;
polypropylene, hard elastic, SAXS of, electron micrograph of, density of
;
Chemistry
;
Polymer and Materials Science
Source:
Wiley InterScience Backfile Collection 1832-2000
Topics:
Chemistry and Pharmacology
,
Physics
Notes:
Small-angle x-ray scattering (SAXS) intensity for the lamellar structure of polymeric materials has been formulated with consideration of structural defects such as the finiteness of the lamellar stack, the lamellar bend, and the paracrystalline distortions. In particular, the effects of the lamellar bend on the SAXS profile have been elucidated on the basis of Vonk'xss formula γ1(x) - γ01(x)exp(-2x/d). Here, the scattering profile due to the lamellar bend is shown to be expressed by a Cauchy function. The integral breadth is equal to 2π/d, being independent of the order of scattering. As an example of the SAXS analysis based on the theory, the characterization of the lamellar structure in the “hard” elastic polypropylene films is reported. The long period and the lamellar thickness are evaluated from the correlation function, and the distortion length and Hosemann's g factor are estimated according to the procedure presented here. On the basis of these structural parameters, the relationship between the manufacturing process and the lamellar structure of the polypropylene films is discussed. © 1993 John Wiley & Sons, Inc.
Additional Material:
7 Ill.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1002/polb.1993.090310912
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