Library

feed icon rss

Your email was sent successfully. Check your inbox.

An error occurred while sending the email. Please try again.

Proceed reservation?

Export
  • 1
    Electronic Resource
    Electronic Resource
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 15 (1986), S. 245-250 
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: A systematic study has been made of the line shapes of x-ray fluorescence spectra obtained with a conventional spectrometer using various analysing crystals and experimental conditions. It was found that each component of the K and L spectra can be closely matched by the sum of an asymmetric Gaussian and Lorentzian, namely the pseudo-Voigt function. Analysis of spectra in the 0.4-3 Å range showed that profile shapes are functions of 2θ, the analysing crystal and the collimating system, but nearly independent of chemical state, specimen thickness and operating voltage. For a fixed analysing crystal and collimator, larger values of 2θ exhibited lower Gaussian content and higher asymmetry. Using an LiF (200) crystal, spectra obtained for 2θ° 〈 20° were found to be pure Gaussian and symmetric, indicating the dominance of the instrumental effects. As 2θ increased, the Lorentzian component or the spectral effects emerged and the shapes became asymmetric. The analysing crystal has a pronounced effect on the experimental profile shapes. Use of a graphite (002) instead of an LiF (200) crystal yielded profiles three times wider and with twice the Lorentzian content. The differences between PET and LiF crystals were smaller. The accuracy achieved in using the pseudo. Voigt function to describe the experimental XRF spectra demonstrates the convenience and effectiveness of the function in obtaining precise fluorescence intensities, especially in the case of poor counting statistics and/or overlaps.
    Additional Material: 3 Ill.
    Type of Medium: Electronic Resource
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
  • 2
    Electronic Resource
    Electronic Resource
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 4 (1975), S. 196-201 
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: A Comprehensive study of the interfacing of an X-ray energy dispersive spectrometer to a transmission electron microscope is presented. Optimum detector location, sample tilt, collimation and accelerating voltage are discussed. Quantitative elemental analysis is obtained for thin film specimens using corrections for spectrometer response, absorption and background. Peak spectra are sorted using a method of profile fitting based on nonlinear simplex minimization. Using a simple analysis scheme, the peak data is reduced to elemental composition with an accuracy and precision on the order of 1%. Examples from Fe-Ni and Ho-Co alloys are given.
    Additional Material: 7 Ill.
    Type of Medium: Electronic Resource
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
  • 3
    Electronic Resource
    Electronic Resource
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 10 (1981), S. 28-30 
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: An improved version of the LAMA program for the quantitative analysis of composition and mass thickness of thin film materials by X-ray fluorescence (XRF) has been developed. The divergence and slow convergence problems occasionally experienced with the LAMA-1 program have been eliminated by using the linear approximation method and the algorithm of simultaneous refinement of composition and thickness to greatly increase its capability and performance. A study of over a hundred simulated thin films showed that the LAMA-2 program converged much faster than LAMA-1 and gave better accuracy. The efficiency of the program has been improved to the point where it is feasible to operate on a minicomputer.
    Additional Material: 2 Ill.
    Type of Medium: Electronic Resource
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
  • 4
    Electronic Resource
    Electronic Resource
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 18 (1989), S. 53-56 
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: An evaluation of the x-ray fluorescence analysis of light elements (B, C, N and O) using synthetic multilayers and a conventional x-ray spectrometer has been conducted. It is shown that effective measurements of long-wavelength x-rays can be made by using properly selected synthetic multilayers. For both B and C K radiations the Ni/C (2d = 158.8 Å) multilayer has the highest reflectivities, whereas the V/C (121.8 Å) and the W/Si (55.4 Å) multilayers have the best resolving powers. For N and O K radiations, the W/Si (80.2 and 55.4 Å) multilayers are preferred. The 80.2 and 55.4 Å W/Si multilayers produce the highest intensity and resolving power, respectively. The detection limits of the light elements using the multilayers have also been calculated, and it is shown that levels as low as 0.02% are achievable for the carbon and oxygen analyses using the Ni/C and W/Si multilayers, respectively.
    Additional Material: 5 Ill.
    Type of Medium: Electronic Resource
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
  • 5
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: A precise and practical x-ray fluorescence technique using the fundamental-parameter method and the LAMA computer program for the simultaneous determination of composition and thickness of single- and multiple-layer thin films is reviewed. Results from the analysis of Fe-Ni single-layer and chromium, Fe-Ni, copper triple-layer thin films are discussed. The analysis showed that x-ray absorption and enhancement caused by the inter-element effect in single-layer and the inter-layer effect in multiple-layer films were corrected properly. The accuracy of the analysis is estimated to be ±1% for composition and ±3% for thickness.
    Additional Material: 1 Ill.
    Type of Medium: Electronic Resource
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
Close ⊗
This website uses cookies and the analysis tool Matomo. More information can be found here...