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  • Chemistry  (2)
  • 1
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The efficiency of a Ge(In) semiconductor x-ray detector was measured in the energy region 1-25 keV using proton-induced x-rays from thick targets and from thin targets of standard thickness, and the results of the two calibration methods were compared. A proton energy of 2.00 MeV was used in an external beam facility. A model based on fundamental parameters (mass absorption coefficients, fluorescence yields and relative x-ray emission rates) was used to reproduce the experimental results.
    Additional Material: 2 Ill.
    Type of Medium: Electronic Resource
    Library Location Call Number Volume/Issue/Year Availability
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  • 2
    Electronic Resource
    Electronic Resource
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 17 (1988), S. 13-16 
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The production yields for characteristic x-rays from the bombardment of thick targets by protons are calculated by integrating the x-ray production cross-section for each element for the whole range of the protons, taking into account the self-absorption of x-rays. A simple approximation which can be applied with a pocket calculator is also presented, using simplified relationships for the energy dependence of the proton stopping power and the x-ray production cross-sections. The approximation allows very fast calculations, has an accuracy of better than 5% for low-energy protons and is also very useful for the first steps in a computer program for PIXE analysis of thick targets, using the method of iterations. The calculated yields are compared with experimental results obtained on thick specimens of pure elements, compounds and standards.
    Additional Material: 4 Ill.
    Type of Medium: Electronic Resource
    Library Location Call Number Volume/Issue/Year Availability
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