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  • 1
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 25 (1997), S. 677-682 
    ISSN: 0142-2421
    Keywords: silicon ; light irradiation ; surface tension ; transmission electron microscopy ; Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The morphological differences between porous silicon formed in the dark or under illumination have been studied by means of gravimetric measurements, transmission electron microscopy, infrared spectroscopy and cyclic voltammetry. Photoetching has been found to give rise to a complex surface structure, due to the presence of narrower outer silicon fibres, which suffer a more severe cracking process upon drying. © 1997 by John Wiley & Sons, Ltd.
    Additional Material: 6 Ill.
    Type of Medium: Electronic Resource
    Library Location Call Number Volume/Issue/Year Availability
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  • 2
    Electronic Resource
    Electronic Resource
    Chichester : Wiley-Blackwell
    Journal of Chemical Technology AND Biotechnology 68 (1997), S. 243-246 
    ISSN: 0268-2575
    Keywords: Trigonopsis variabilis ; oxygen consumption ; Chemistry ; Biochemistry and Biotechnology
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Process Engineering, Biotechnology, Nutrition Technology
    Notes: The metabolic and kinetic parameters of oxygen consumption by the yeast Trigonopsis variabilis under conditions of induced and non-induced D-amino acid oxidase are described for the first time. These parameters can be calculated from the results of a single batch fermentation running at an oxygen-limiting condition. The values obtained for the parameters may be used as a basis for the calculation of the aeration and stirring requirements and optimal oxygen conditions for the growth of T. variabilis in batch, fed-batch or continuous fermentations. © 1997 SCI.
    Additional Material: 3 Ill.
    Type of Medium: Electronic Resource
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