Electronic Resource
New York, NY
:
Wiley-Blackwell
Journal of Electron Microscopy Technique
1 (1984), S. 83-94
ISSN:
0741-0581
Keywords:
Scanning transmission electron microscopy
;
Image contrast
;
Inelastic scattering
;
Thick specimens
;
Life and Medical Sciences
;
Cell & Developmental Biology
Source:
Wiley InterScience Backfile Collection 1832-2000
Topics:
Natural Sciences in General
Notes:
For scanning transmission electron microscopy (STEM) images obtained with relatively small objective aperture sizes, the contrast of small objects contained within thick specimens may be considerably enhanced by using an off-axis detector aperture situated on the edge of the central beam spot. The effect is demonstrated for both crystalline and amorphous specimens. The effect arises because the detector collects part of the small angle inelastic scattering and is modified by refraction effects for specimens of rapidly changing thickness.
Additional Material:
5 Ill.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1002/jemt.1060010108
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