ISSN:
1435-1536
Keywords:
Key words Evanescent wave
;
Surface modification
;
Light scattering
;
Polystyrene latex
;
Electrostatic interaction
Source:
Springer Online Journal Archives 1860-2000
Topics:
Chemistry and Pharmacology
,
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
Notes:
Abstract The profile of the interaction potential between polystyrene latex particle and chemically modified glass surface was estimated directly by the evanescent wave light scattering microscope (EVLSM) method; this enables us to measure the distance between particle and surface as a function of time in the order of less than a millisecond. The minimum of the potential profile, which is the result of an electrostatic repulsion and an apparent attraction by gravity between the particle and surface, was clearly observed. To change the electrostatic nature, the glass surface was chemically modified by treatment with a silanization reagent and a vinyl monomer with a sulfonate group. As the absolute value of the zeta potential of the glass surface became larger, the position of the potential minimum on the interaction potential profile shifted away from the glass surface, reflecting an increase of electrostatic repulsion between the particle and the wall. The ionic strength dependence of the potential profile was also clearly observed. In conclusion, EVLSM is a powerful tool for the quantitative estimation of particle-wall interactions.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/s003960050377
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