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  • Key words Atomic force microscopy  (1)
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  • 1
    Electronic Resource
    Electronic Resource
    Springer
    Materials research innovations 1 (1997), S. 197-203 
    ISSN: 1433-075X
    Keywords: Key words Atomic force microscopy ; Polar-surface ; Silver iodide
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Abstract  Atomic Force Microscopy is used to determine the crystallographic polarity of the surfaces of β-AgI single crystals. The studies reveal that the hexagonal packed Ag+ plane is the (001) and the I– plane is the (001–). This observation is also consistent with the earlier x-ray diffraction measurements and chemical etching techniques as well as the polarizability and electronegativity of the ions.
    Type of Medium: Electronic Resource
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