ISSN:
1572-879X
Schlagwort(e):
AFM
;
STM
;
XPS
;
Pd thin film
;
pretreatment effect
;
1,3-butadiene hydrogenation
Quelle:
Springer Online Journal Archives 1860-2000
Thema:
Chemie und Pharmazie
Notizen:
Abstract AFM has been used to study the effects of pretreatment gases on Pd/SiO2 supported thin film catalysts during 1,3-butadiene hydrogenation. The Pd/SiO2 catalyst, treated with O2 followed by H2 at 450°C, has an initial conversion of 85% and a surface morphology of 60 x 65 nm2 Pd grains and only deactivates slightly. After a second treatment, the reactivity was fully recovered and the surface morphology exhibits a redispersion of the Pd grains. The catalyst with a similar initial reactivity and morphology but only treated in H2, shows a decrease in activity and coalescence of Pd grains after repeated treatment. XPS studies have shown that the O2 and H2 treated Pd/SiO2 catalyst has a lower Pd binding energy than the H2 treated Pd/SiO2. The effect of the substrate thickness and composition is also reported.
Materialart:
Digitale Medien
URL:
http://dx.doi.org/10.1007/BF00810603
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