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  • 79.20  (1)
  • Photovalence isomerization  (1)
  • standards  (1)
  • 1
    Digitale Medien
    Digitale Medien
    Synthesis and property of [6]-1,4-cyclophaneanthraquinone: A novel anthraquinone derivative undergoing photovalence isomerization
    Amsterdam : Elsevier
    Tetrahedron Letters 33 (1992), S. 953-956 
    Details
    ISSN: 0040-4039
    Schlagwort(e): Cyclophaneanthraquinone ; Dewar-anthraquinone ; Photochromism ; Photovalence isomerization
    Quelle: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
    Thema: Chemie und Pharmazie
    Materialart: Digitale Medien
    URL: http://linkinghub.elsevier.com/retrieve/pii/S0040-4039(00)91586-7
    Bibliothek Standort Signatur Band/Heft/Jahr Verfügbarkeit
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  • 2
    Digitale Medien
    Digitale Medien
    Comment on “Evaluation of concentration-depth profiles by sputtering in SIMS and AES” by S. Hofmann (1979)
    Springer
    Applied physics 18 (1979), S. 425-426 
    Details
    ISSN: 1432-0630
    Schlagwort(e): 79.20
    Quelle: Springer Online Journal Archives 1860-2000
    Thema: Maschinenbau , Physik
    Notizen: Abstract The statistics of the sputtering process, which has been used to explain sputterbroadening effect due to surface roughness, has been treated with conditional probabilities. This results in the relationship, $${{\Delta z} \mathord{\left/ {\vphantom {{\Delta z} z}} \right. \kern-\nulldelimiterspace} z} \propto \sqrt {(1 + \overline \gamma )/z} $$ , instead of $${{\Delta z} \mathord{\left/ {\vphantom {{\Delta z} z}} \right. \kern-\nulldelimiterspace} z} \propto {1 \mathord{\left/ {\vphantom {1 {\sqrt z }}} \right. \kern-\nulldelimiterspace} {\sqrt z }}$$ derived by S. Hofmann [Appl. Phys.9, 59 (1976)], where δz,z, and $$\overline \gamma $$ are the depth resolution, sputtered depth and sputtering yield, respectively.
    Materialart: Digitale Medien
    URL: http://dx.doi.org/10.1007/BF00899698
    Bibliothek Standort Signatur Band/Heft/Jahr Verfügbarkeit
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  • 3
    Digitale Medien
    Digitale Medien
    Development of standards for surface analysis by ISO technical committee 201 on surface chemical analysis (1997)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 25 (1997), S. 860-868 
    Details
    ISSN: 0142-2421
    Schlagwort(e): ISO/TC 201 on Surface Chemical Analysis ; standards ; surface analysis ; Chemistry ; Polymer and Materials Science
    Quelle: Wiley InterScience Backfile Collection 1832-2000
    Thema: Physik
    Notizen: A summary is given of the organization and work of Technical Committee 201 on Surface Chemical Analysis of the International Organization for Standardization (ISO). Twelve potential international standards are currently in various stages of development and a further thirteen standards are expected to be developed shortly. Information is also given on expected future needs for standards with examples from a recent survey of experts in Auger electron spectroscopy and x-ray photoelectron spectroscopy. © 1997 John Wiley & Sons, Ltd.
    Zusätzliches Material: 14 Tab.
    Materialart: Digitale Medien
    Bibliothek Standort Signatur Band/Heft/Jahr Verfügbarkeit
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    Artikel (Nationallizenzen)
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