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  • 1
    Electronic Resource
    Electronic Resource
    Springer
    Numerical algorithms 19 (1998), S. 1-12 
    ISSN: 1572-9265
    Keywords: Lagrange's equations of motion ; viscoelasticity ; semi-explicit methods ; 92C10
    Source: Springer Online Journal Archives 1860-2000
    Topics: Computer Science , Mathematics
    Notes: Abstract In this paper a mathematical model is developed for the dynamical behaviour of a hydrostatic skeleton. The basic configuration is taken from the worm-like shape of the medicinal leech. It consists of a sequence of hexahedra with damped elastic springs as edges to model the various parts of the musculature. The system is stabilized by the constraint of constant volume either in the whole body or in prescribed compartments. We set up Lagrange's equations of motion with the Lagrange multipliers being the pressure values in the compartments. The equations of motion lead to a large differential-algebraic system which is solved by an application of semi-explicit numerical methods. Though the model has not yet been adapted to experimental data, first simulations with a simplified set of parameters show that it is capable of generating basic movements of the leech such as crawling and swimming.
    Type of Medium: Electronic Resource
    Library Location Call Number Volume/Issue/Year Availability
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  • 2
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 22 (1994), S. 346-349 
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The application of ellipsometry to study the SiOx/Si system subjected to hydrostatic pressures up to 1.8 GPa at temperatures up to 1280 °C is described. The theoretical model of defects as the spherical disturbances of material has been assumed. The ellipsometric parameters have been analysed as a function of defects size and density and compared with data obtained by etching and x-ray methods. The applicability of ellipsometry for near-surface defect structure analysis has been discussed.
    Additional Material: 4 Ill.
    Type of Medium: Electronic Resource
    Library Location Call Number Volume/Issue/Year Availability
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