ISSN:
0142-2421
Keywords:
Chemistry
;
Polymer and Materials Science
Source:
Wiley InterScience Backfile Collection 1832-2000
Topics:
Physics
Notes:
Atomic force microscopy (AFM) is applied on two different types of thin latex films. Polystyrene dispersion particles are prepared by various methods to form well-ordered monolayers and multilayers. Atomic force microscopy serves as a tool to study the surface structures of such films and to find the optimal preparation conditions. The micromorphology of the second system, an adhesive tape, was imaged successfully by AFM running in dynamic mode. Besides the morphological studies, the interaction between the sticky surface and the AFM tip is measured by the damping of the cantilever oscillation versus tip-sample distance.
Additional Material:
10 Ill.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1002/sia.740230614
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