ISSN:
0142-2421
Keywords:
Chemistry
;
Polymer and Materials Science
Source:
Wiley InterScience Backfile Collection 1832-2000
Topics:
Physics
Notes:
A new approach to the suppression of molecular ions in secondary ion mass spectra of insulating specimens is reported. Using a Cameca IMS 3f instrument, with unconventional primary beam conditions and uncoated samples, it has been possible to almost eliminate the contribution of molecular ions to the mass spectrum. This has resulted in excellent discrimination for major and trace element detection in these materials, including complete resolution of the rare earth elements in a number of minerals.
Additional Material:
5 Ill.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1002/sia.740050503
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