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  • Polymer and Materials Science  (4)
  • 1
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 26 (1998), S. 306-315 
    ISSN: 0142-2421
    Keywords: polycarbonate ; SF6 ; plasma ; XPS, SFM ; AFM ; mass spectroscopy ; Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: A systematic investigation was made of the chemical and morphological influences of SF6 plasma on polycarbonate and the influence of plasma treatment on Al metallization. Mass and ion spectroscopy were used for characterization of the plasma and the etching process. X-ray photoelectron spectroscopy (XPS) measurements were applied for the chemical characterization, while atomic force microscopy (AFM) (static and dynamic mode) served to inspect the surface morphology. All analytical techniques were performed in an ultrahigh vacuum system, in order to prevent the polycarbonate sample from being exposed to ambient air after the plasma treatment. During the etching process we used mass difference spectra to demonstrate the removal of masses 19, 28 and 32 corresponding to HF, CO (N2) and CF. Additionally, the inclusion of fluorine was also observed by this technique.The XPS spectra of polycarbonate surfaces show a significant inclusion of fluorine (C-F, C-F2) and a reduction of the oxygen content after the plasma treatment. Aluminium metallization leads to the formation of an Al-F interlayer; metallic growth of Al is only observed when the metallic layers become thicker than a few nanometres.The AFM investigations have shown that even a short plasma treatment causes changes in morphology (structures with an extension of 20-40 nm). After extended plasma exposure the surface becomes very rough, resulting in poor Al adhesion. On untreated polycarbonate, Al grows in the form of weakly bound clusters, which can only be imaged in the dynamic AFM mode. After plasma treatment, Al grows in the form of well-adhering flat layers without clustering. © 1998 John Wiley & Sons, Ltd.
    Additional Material: 14 Ill.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 23 (1995), S. 416-425 
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Atomic force microscopy (AFM) is applied on two different types of thin latex films. Polystyrene dispersion particles are prepared by various methods to form well-ordered monolayers and multilayers. Atomic force microscopy serves as a tool to study the surface structures of such films and to find the optimal preparation conditions. The micromorphology of the second system, an adhesive tape, was imaged successfully by AFM running in dynamic mode. Besides the morphological studies, the interaction between the sticky surface and the AFM tip is measured by the damping of the cantilever oscillation versus tip-sample distance.
    Additional Material: 10 Ill.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    Weinheim : Wiley-Blackwell
    Chemie Ingenieur Technik - CIT 63 (1991), S. 1030-1031 
    ISSN: 0009-286X
    Keywords: Fernwäme ; Leckortung ; Akustik ; Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology , Process Engineering, Biotechnology, Nutrition Technology
    Additional Material: 2 Ill.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 25 (1997), S. 537-542 
    ISSN: 0142-2421
    Keywords: scanning force microscopy ; polymers ; polyamide ; tensile tester ; Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The structure and the mechanical properties of polyamide (PA) films were studied with scanning force microscopy (SFM). The spherulitic structure of the films was resolved and the amorphous and crystalline regions could be identified without heavy metal staining or evaporation. The identification was achieved with different contrast mechanisms in SFM, such as the force modulation technique and phase imaging.The mechanical properties of the PA films were investigated with a tensile tester. The films were drawn in a uniaxial direction. The deformation of the spherulite structures could be imaged byin situ SFM. A schematic model for the interpretation of the observed structures is presented.© 1997 John Wiley & Sons, Ltd.
    Additional Material: 8 Ill.
    Type of Medium: Electronic Resource
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