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  • 1
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 24 (1996), S. 252-256 
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: X-ray photoelectron spectroscopy (XPS) of Ne ion-bombarded polymer has been carried out in order to examine the cause of HeLa cell adhesion control on polymers. Substrates used were polystyrene (PS) and oxygen plasma-treated polystyrene (PS-O). Neon bombardments into the patterned region of PS and PS-O were performed at an energy of 150 keV with fluences of 1×1014 and 1×1015 ions cm-2. The surface chemical bonding states were investigated by XPS. In HeLa cell adhesion measurements, the Ne-bombarded region of PS with a fluence of 1×1015 ions cm-2 exhibits higher adhesion and spreading of HeLa cells than the unbombarded region. On the contrary, it is found that the Ne-bombarded region of PS-O inhibits HeLa cell adhesion. The XPS results show that Ne bombardment to PS or PS-O destroys the original chemical bonds and consequently produces new functional groups. It is considered that the drastic change of surface chemical bonding states from the pristine states induced by Ne bombardment leads to a clear distinction between increasing and inhibiting HeLa cell adhesion.
    Additional Material: 7 Ill.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 24 (1996), S. 578-582 
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Angle-dependent high-resolution XPS spectra of S 2p, In 3d5/2 and P 2p have been measured on the InP(001) sample etched chemically, treated with (NH4)2Sx at room temperature (RT), exposed to air at RT and annealed at 400°C in a vacuum. Three kinds (S-I, S-II and S-III) of chemical states of sulphur on the (NH4)2Sx-treated InP(001) surface at RT are found. It is suggested that S-I, S-II and S-III correspond to sulphur in the bulk, sulphur bridge-bonded to indium on the surface and elemental sulphur, respectively. Chemical state of S-III is decreased for the treated sample exposed to air at RT for 1 month. It is removed upon annealing the sample at 400°C in a vacuum, while S-I and S-II remain on the surface. The thickness of the sulphide layer on the annealed surface is estimated to be about one monolayer. Angle-dependent XPS spectra of S 2p and In 3d5/2 are discussed.
    Additional Material: 4 Ill.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 21 (1994), S. 724-730 
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: An efficient method for quantitative XPS analysis is the so-called multiline approach. This method does not require standards, it takes into account the instrumental and matrix effects and it derives quantitative information from statistical analysis of all photoelectron intensities visible in the spectra. One can expect the reliability of this approach to be better than the reliability of methods involving uncorrected relative sensitivity factors. This paper summarizes recent improvements in the multiline approach. In particular, a new expression for the universal energy dependence of the inelastic mean free path is currently used. Furthermore, the statistical analysis has been modified in order to account properly for the error in the countrates. Finally, a database with physical constants has been added (photoionization cross-sections, asymmetry parameters, binding energies, etc.) to avoid errors of polynomial approximations. The modified algorithm of the multiline approach was applied to photoelectron intensities measured for AuCu alloys in four laboratories. Surfaces of these alloys were sputtered with 2 keV Ar+ ions, because at this energy the selective sputtering effects are expected to be negliible. Very consistent results were obtained. The average deviation from the bulk surface composition was found to be equal to ±3.2 at.%. Extensive software implementing the described version of the multiline approach is presently being developed.
    Additional Material: 6 Ill.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    New York : Wiley-Blackwell
    Journal of Polymer Science: Polymer Letters Edition 22 (1984), S. 129-133 
    ISSN: 0360-6384
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology
    Additional Material: 2 Tab.
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    New York, NY [u.a.] : Wiley-Blackwell
    Journal of Applied Polymer Science 51 (1994), S. 2131-2137 
    ISSN: 0021-8995
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology , Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Polypropylene films were treated with the CHCI3 plasma, and their chemical composition was analyzed with XPS and ART IR spectroscopy. The CHCI3 plasma irradiation made polypropylene films hydrophilic. The advancing contact angle decreases from 95° for the untreated to about 73° for the CHCI3 plasma-treated films. In the CHCI3 plasma irradiation, the chlorination occurs, and C—Cl, C—Cl2, and C—Cl3 units are formed in the polypropylene films. Simultaneously with the chlorination, unsaturated units (C=C and conjugated C=C units) are formed from dehydrogen chlorination of the chlorinated products, but the oxygen incorporation into the films is low. The CHCI3 plasma is preferred in chlorination of polypropylene films to the CCl4 plasma. © 1994 John Wiley & Sons, Inc.
    Additional Material: 4 Ill.
    Type of Medium: Electronic Resource
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  • 6
    Electronic Resource
    Electronic Resource
    New York : Wiley-Blackwell
    Journal of Polymer Science Part A: General Papers 3 (1965), S. 2637-2651 
    ISSN: 0449-2951
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology , Physics
    Notes: Viscoelastic properties of unsaturated polyesters were investigated in the glass-rubber transition region in relation to the temperature dependence of specific volume. Polyesters which are homologous with respect to crosslinking density were prepared by using mixtures of succinic and fumaric acid as the dibasic acid component. The temperature dependence of the specific volume was determined by refractive index measurement, the specific refractivity being assumed to be independent of temperature. The temperature dispersion of dynamic viscoelasticity was measured at a constant frequency. Results are summarized as follows. Specific volume and glass temperature are linearly related to the logarithm of crosslinking density. The thermal expansion coefficient and steepness of viscoelastic dispersion decrease with increasing crosslinking density. Fractional free volume and expansion coefficient of free volume, both of which were calculated by WLF equation, are in good agreement with the temperature dependence of specific volume. The results indicate that the effect of crosslinking is largely attributable to the change in amount and distribution of free volume in polymer networks.
    Additional Material: 12 Ill.
    Type of Medium: Electronic Resource
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  • 7
    Electronic Resource
    Electronic Resource
    New York : Wiley-Blackwell
    Journal of Polymer Science: Polymer Letters Edition 20 (1982), S. 563-568 
    ISSN: 0360-6384
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology
    Additional Material: 5 Ill.
    Type of Medium: Electronic Resource
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  • 8
    Electronic Resource
    Electronic Resource
    New York : Wiley-Blackwell
    Journal of Polymer Science Part A-1: Polymer Chemistry 10 (1972), S. 2473-2477 
    ISSN: 0449-296X
    Keywords: Physics ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology
    Additional Material: 4 Ill.
    Type of Medium: Electronic Resource
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