ZIB

Hits per page

hit 1 - 1 | 1 hit

Sorting

Electronic Resource

Ellipsometric investigation of single crystalline Cz—Si subjected to hydrostatic pressure (1994)

Kamińska, Anna M. ; Misiuk, Andrzej ; Wolf, Jürgen

Chichester [u.a.] : Wiley-Blackwell

Surface and Interface Analysis 22 (1994), S. 346-349

add to mindlist on the mindlist

Details

ISSN: 0142-2421

Keywords: Chemistry ; Polymer and Materials Science

Source: Wiley InterScience Backfile Collection 1832-2000

Topics: Physics

Notes: The application of ellipsometry to study the SiOx/Si system subjected to hydrostatic pressures up to 1.8 GPa at temperatures up to 1280 °C is described. The theoretical model of defects as the spherical disturbances of material has been assumed. The ellipsometric parameters have been analysed as a function of defects size and density and compared with data obtained by etching and x-ray methods. The applicability of ellipsometry for near-surface defect structure analysis has been discussed.

Additional Material: 4 Ill.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1002/sia.740220175

Permalink

Library	Location	Call Number	Volume/Issue/Year	Availability

Others were also interested in ...

Paper (German National Licenses)

Fulltext

hit 1 - 1 | 1 hit