ISSN:
1573-5060
Keywords:
Triticum aestivum
;
wheat
;
near-isogenic lines
;
NILs
;
Puccinia recondita f.sp. tritici
;
leaf rust
;
Puccinia striiformis
;
yellow rust
;
backcross
;
variation
;
background resistance
Source:
Springer Online Journal Archives 1860-2000
Topics:
Agriculture, Forestry, Horticulture, Fishery, Domestic Science, Nutrition
Notes:
Summary Using the cultivar Arina as the recurrent parent, six backcrosses were made with two donor lines carrying the leaf rust resistance genes Lr1 and Lr9, respectively. Selection for leaf rust resistance occurred at the seedling stage in the greenhouse; the first plants transferred to the field were BC6F4s. Frequency distribution of the 332 Lr1/7 × Arina and the 335 Lr9/7 × Arina lines showed continuous variation for yellow rust resistance and heading date in these leaf rust near-isogenic lines (NILs). Similar results were also obtained for plant height, for resistance to powdery mildew and glume blotch, as well as for baking quality characters in another set of more advanced NILs. The available information on the behaviour of one of the parents of cultivar Arina led to the conclusion that the expressed yellow rust resistance is quantitative and might possibly be durable.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/BF00032154
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