Electronic Resource
Amsterdam
:
Elsevier
Micron
24 (1993), S. 251-256
ISSN:
0968-4328
Keywords:
EELS
;
TEM
;
analytical electron microscopy
;
elemental analysis
Source:
Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
Topics:
Electrical Engineering, Measurement and Control Technology
,
Natural Sciences in General
Type of Medium:
Electronic Resource
URL:
http://linkinghub.elsevier.com/retrieve/pii/0968-4328(93)90050-B
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