ISSN:
1572-9605
Schlagwort(e):
XPS
;
Cuprate Superconductor
;
Valence fluctuations
;
Tc retention
Quelle:
Springer Online Journal Archives 1860-2000
Thema:
Elektrotechnik, Elektronik, Nachrichtentechnik
,
Physik
Notizen:
Abstract Structural and x-ray photoelectron spectroscopy (XPS) studies of the Tl1−xPbxSr1+xLa1−xCuO5−y (0.0≤x≤0.5) system have been carried out. The unit cell parameters increase with x. Irrespective of x the Tc is retained in this series and the optimum hole concentration (nh) is maintained for x≤ 0.5. An increase in Tl 4f and O ls binding energy with x suggests a reduction in their oxidation state. Origin of holes is discussed in terms of charge transfer between Tl, Pb and CuO2 layers.
Materialart:
Digitale Medien
URL:
http://dx.doi.org/10.1023/A:1022639525484
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